Inventor · disambiguated record
Jifa Hao
Also filed as: HAO JIFA
11 granted patents·2 pending applications·136 citations·filing 1999–2015
90Inventor score
Top patents by PatentIndex Score
13 records- 0187US7897471B2Method and apparatus to improve the reliability of the breakdown voltage in high voltage devicesFAIRCHILD SEMICONDUCTOR·Filed 2008·Granted Mar 1, 2011·14 cites·21 claims
- 0282US6635535B2Dense trench MOSFET with decreased etch sensitivity to deposition and etch processingFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted Oct 21, 2003·28 cites·3 claims
- 0381US6573569B2Trench MOSFET with low gate chargeFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted Jun 3, 2003·35 cites·29 claims
- 0480US8872278B2Integrated gate runner and field implant termination for trench devicesHAO JIFA·Filed 2011·Granted Oct 28, 2014·9 cites·18 claims
- 0574US8269277B2RESURF device including increased breakdown voltageHAO JIFA·Filed 2010·Granted Sep 18, 2012·4 cites·20 claims
- 0673US7436021B2Dense trench MOSFET with decreased etch sensitivity to deposition and etch processingFAIRCHILD SEMICONDUCTOR·Filed 2003·Granted Oct 14, 2008·16 cites·7 claims
- 0763US9537001B2Reduction of degradation due to hot carrier injectionFAIRCHILD SEMICONDUCTOR·Filed 2015·Granted Jan 3, 2017·1 cites·19 claims
- 0863US6358825B1Process for controlling lifetime in a P-I-N diode and for forming diode with improved lifetime controlFAIRCHILD SEMICONDUCTOR·Filed 2000·Granted Mar 19, 2002·13 cites·20 claims
- 0949US7332750B1Power semiconductor device with improved unclamped inductive switching capability and process for forming sameFAIRCHILD SEMICONDUCTOR·Filed 2000·Granted Feb 19, 2008·5 cites·17 claims
- 1047US8357562B2Method to improve the reliability of the breakdown voltage in high voltage devicesFAIRCHILD SEMICONDUCTOR·Filed 2011·Granted Jan 22, 2013·0 cites·16 claims
- 1147US6077744ASemiconductor trench MOS devicesINTERSIL CORP·Filed 1999·Granted Jun 20, 2000·11 cites·7 claims
- 1245US2008210974A1High voltage LDMOSFAIRCHILD SEMICONDUCTOR·Filed 2008·Application pending·0 cites
- 1335US2013026569A1Methods and apparatus related to hot carrier injection reliability improvementHAO JIFA·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jifa Hao files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →