Inventor · disambiguated record
Peter A. Habitz
Also filed as: HABITZ PETER A · HABITZ PETER ANTON
82 granted patents·1 pending application·898 citations·filing 1989–2017
99Inventor score
Top patents by PatentIndex Score
83 records- 0194US9104834B2Systems and methods for single cell product path delay analysisIBM·Filed 2014·Granted Aug 11, 2015·20 cites·17 claims
- 0293US8539429B1System yield optimization using the results of integrated circuit chip performance path testingBICKFORD JEANNE P·Filed 2012·Granted Sep 17, 2013·11 cites·20 claims
- 0393US7620921B2IC chip at-functional-speed testing with process coverage evaluationIBM·Filed 2007·Granted Nov 17, 2009·33 cites·30 claims
- 0492US7089143B2Method and system for evaluating timing in an integrated circuitIBM·Filed 2004·Granted Aug 8, 2006·41 cites·19 claims
- 0591US8856709B2Systems and methods for correlated parameters in statistical static timing analysisIBM·Filed 2013·Granted Oct 7, 2014·12 cites·16 claims
- 0691US7181711B2Prioritizing of nets for coupled noise analysisIBM·Filed 2005·Granted Feb 20, 2007·28 cites·20 claims
- 0790US7555740B2Method and system for evaluating statistical sensitivity credit in path-based hybrid multi-corner static timing analysisIBM·Filed 2007·Granted Jun 30, 2009·25 cites·22 claims
- 0889US8543966B2Test path selection and test program generation for performance testing integrated circuit chipsBICKFORD JEANNE P·Filed 2011·Granted Sep 24, 2013·8 cites·24 claims
- 0989US7444608B2Method and system for evaluating timing in an integrated circuitIBM·Filed 2006·Granted Oct 28, 2008·13 cites·11 claims
- 1088US7489204B2Method and structure for chip-level testing of wire delay independent of silicon delayIBM·Filed 2005·Granted Feb 10, 2009·17 cites·20 claims
- 1187US8141012B2Timing closure on multiple selective corners in a single statistical timing runBUCK NATHAN C·Filed 2009·Granted Mar 20, 2012·18 cites·22 claims
- 1286US8413095B1Statistical single library including on chip variation for rapid timing and power analysisDUBUQUE JOHN P·Filed 2012·Granted Apr 2, 2013·19 cites·5 claims
- 1386US7716616B2Slack sensitivity to parameter variation based timing analysisIBM·Filed 2007·Granted May 11, 2010·12 cites·25 claims
- 1485US8769452B2Parasitic extraction in an integrated circuit with multi-patterning requirementsIBM·Filed 2012·Granted Jul 1, 2014·7 cites·10 claims
- 1585US8707233B2Systems and methods for correlated parameters in statistical static timing analysisFOREMAN ERIC A·Filed 2011·Granted Apr 22, 2014·7 cites·16 claims
- 1685US8468483B2Method, system and program storage device for performing a parameterized statistical static timing analysis (SSTA) of an integrated circuit taking into account setup and hold margin interdependenceBUCK NATHAN C·Filed 2011·Granted Jun 18, 2013·9 cites·20 claims
- 1785US7784003B2Estimation of process variation impact of slack in multi-corner path-based static timing analysisIBM·Filed 2007·Granted Aug 24, 2010·17 cites·20 claims
- 1885US7418689B2Method of generating wiring routes with matching delay in the presence of process variationIBM·Filed 2005·Granted Aug 26, 2008·12 cites·18 claims
- 1984US8949765B2Modeling multi-patterning variability with statistical timingIBM·Filed 2013·Granted Feb 3, 2015·5 cites·7 claims
- 2084US7302673B2Method and system for performing shapes correction of a multi-cell reticle photomask designIBM·Filed 2005·Granted Nov 27, 2007·7 cites·20 claims
- 2183US8850378B2Hierarchical design of integrated circuits with multi-patterning requirementsIBM·Filed 2012·Granted Sep 30, 2014·6 cites·12 claims
- 2283US8832625B2Systems and methods for correlated parameters in statistical static timing analysisIBM·Filed 2013·Granted Sep 9, 2014·5 cites·18 claims
- 2383US8141014B2System and method for common history pessimism relief during static timing analysisFOREMAN ERIC A·Filed 2009·Granted Mar 20, 2012·12 cites·23 claims
- 2482US9058034B2Integrated circuit product yield optimization using the results of performance path testingBICKFORD JEANNE P·Filed 2012·Granted Jun 16, 2015·5 cites·20 claims
- 2581US7401307B2Slack sensitivity to parameter variation based timing analysisIBM·Filed 2004·Granted Jul 15, 2008·24 cites·9 claims
- 2680US9157956B2Adaptive power control using timing canonicalsBICKFORD JEANNE P·Filed 2012·Granted Oct 13, 2015·4 cites·24 claims
- 2780US8806402B2Modeling multi-patterning variability with statistical timingIBM·Filed 2012·Granted Aug 12, 2014·4 cites·11 claims
- 2880US7089129B2Electromigration check of signal nets using net capacitance to evaluate thermal characteristicsIBM·Filed 2003·Granted Aug 8, 2006·29 cites·23 claims
- 2980US6430729B1Process and system for maintaining 3 sigma process tolerance for parasitic extraction with on-the-fly biasingIBM·Filed 2000·Granted Aug 6, 2002·34 cites·27 claims
- 3080US6185722B1Three dimensional track-based parasitic extractionIBM·Filed 1998·Granted Feb 6, 2001·102 cites·28 claims
- 3179US8560989B2Statistical clock cycle computationBUCK NATHAN·Filed 2011·Granted Oct 15, 2013·6 cites·20 claims
- 3279US7684969B2Forming statistical model of independently variable parameters for timing analysisIBM·Filed 2005·Granted Mar 23, 2010·10 cites·24 claims
- 3379US7681157B2Variable threshold system and method for multi-corner static timing analysisIBM·Filed 2007·Granted Mar 16, 2010·10 cites·15 claims
- 3478US8726201B2Method and system to predict a number of electromigration critical elementsBICKFORD JEANNE P·Filed 2010·Granted May 13, 2014·6 cites·21 claims
- 3578US7856607B2System and method for generating at-speed structural tests to improve process and environmental parameter space coverageIBM·Filed 2007·Granted Dec 21, 2010·8 cites·25 claims
- 3678US6574782B1Decoupled capacitance calculator for orthogonal wiring patternsIBM·Filed 2000·Granted Jun 3, 2003·31 cites·21 claims
- 3777US8768679B2System and method for efficient modeling of NPskew effects on static timing testsBUCK NATHAN C·Filed 2010·Granted Jul 1, 2014·5 cites·21 claims
- 3877US7266474B2Ring oscillator structure and method of separating random and systematic tolerance valuesIBM·Filed 2005·Granted Sep 4, 2007·8 cites·10 claims
- 3976US8490040B2Disposition of integrated circuits using performance sort ring oscillator and performance path testingBICKFORD JEANNE P·Filed 2011·Granted Jul 16, 2013·3 cites·29 claims
- 4076US7886246B2Methods for identifying failing timing requirements in a digital designIBM·Filed 2008·Granted Feb 8, 2011·7 cites·10 claims
- 4176US6490708B2Method of integrated circuit design by selection of noise tolerant gatesIBM·Filed 2001·Granted Dec 3, 2002·24 cites·32 claims
- 4275US8108816B2Device history based delay variation adjustment during static timing analysisFOREMAN ERIC A·Filed 2009·Granted Jan 31, 2012·7 cites·20 claims
- 4375US7870525B2Slack sensitivity to parameter variation based timing analysisIBM·Filed 2008·Granted Jan 11, 2011·5 cites·20 claims
- 4475US7865861B2Method of generating wiring routes with matching delay in the presence of process variationIBM·Filed 2008·Granted Jan 4, 2011·5 cites·13 claims
- 4574US9378328B2Modeling multi-patterning variability with statistical timingIBM·Filed 2014·Granted Jun 28, 2016·2 cites·10 claims
- 4674US8458632B2Efficient slack projection for truncated distributionsFOREMAN ERIC A·Filed 2011·Granted Jun 4, 2013·4 cites·20 claims
- 4774US8086988B2Chip design and fabrication method optimized for profitBUCK NATHAN·Filed 2009·Granted Dec 27, 2011·7 cites·25 claims
- 4874US6948146B2Simplified tiling pattern methodIBM·Filed 2003·Granted Sep 20, 2005·20 cites·22 claims
- 4974US6477686B1Method of calculating 3-dimensional fringe characteristics using specially formed extension shapesIBM·Filed 2000·Granted Nov 5, 2002·21 cites·30 claims
- 5073US8141025B2Method of performing timing analysis on integrated circuit chips with consideration of process variationsSINHA DEBJIT·Filed 2009·Granted Mar 20, 2012·6 cites·17 claims
Showing the top 50 of 83 patent records by PatentIndex Score.
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