Inventor · disambiguated record
Katsunori Yahashi
Also filed as: YAHASHI KATSUNORI
22 granted patents·11 pending applications·529 citations·filing 1998–2015
95Inventor score
Top patents by PatentIndex Score
33 records- 0198US8294199B2Nonvolatile semiconductor memory device and method for manufacturing the sameYAHASHI KATSUNORI·Filed 2010·Granted Oct 23, 2012·165 cites·20 claims
- 0295US8492824B2Semiconductor memory device and method for manufacturing sameYAHASHI KATSUNORI·Filed 2011·Granted Jul 23, 2013·37 cites·8 claims
- 0394US8072024B2Nonvolatile semiconductor memory device and method for manufacturing sameISHIKAWA MASAO·Filed 2009·Granted Dec 6, 2011·37 cites·17 claims
- 0493US6225650B1GAN group crystal base member having low dislocation density, use thereof and manufacturing methods thereofMITSUBISHI CABLE IND LTD·Filed 1998·Granted May 1, 2001·193 cites·12 claims
- 0590US7683436B2Semiconductor device having a pole-shaped portion and method of fabricating the sameTOSHIBA KK·Filed 2007·Granted Mar 23, 2010·19 cites·14 claims
- 0689US8487365B2Semiconductor device and method for manufacturing sameSASAKI TOSHIYUKI·Filed 2011·Granted Jul 16, 2013·13 cites·4 claims
- 0786US8648404B2Nonvolatile semiconductor memory device, three-dimensional semiconductor device, and method of manufacturing the sameKO NIKKA·Filed 2011·Granted Feb 11, 2014·15 cites·20 claims
- 0881US8313998B2Method for manufacturing semiconductor deviceSATONAKA TOMOYA·Filed 2010·Granted Nov 20, 2012·11 cites·20 claims
- 0980US8062940B2Method of manufacturing semiconductor memory device, and semiconductor memory deviceKO NIKKA·Filed 2009·Granted Nov 22, 2011·14 cites·16 claims
- 1079US8649217B2Non-volatile memory device and manufacturing method of the sameKUNIYA TAKUJI·Filed 2012·Granted Feb 11, 2014·5 cites·20 claims
- 1178US8273628B2Semiconductor device manufacturing method including exposing electrode layers into a holeYAHASHI KATSUNORI·Filed 2010·Granted Sep 25, 2012·5 cites·15 claims
- 1271US7928483B2Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2009·Granted Apr 19, 2011·4 cites·10 claims
- 1369US8211783B2Method for manufacturing semiconductor device including a patterned SiOC film as a maskSAKURAI NORIKO·Filed 2010·Granted Jul 3, 2012·4 cites·17 claims
- 1467US7939891B2Semiconductor device having MISFETs and manufacturing method thereofTOSHIBA KK·Filed 2009·Granted May 10, 2011·4 cites·8 claims
- 1566US9570461B2Method for manufacturing semiconductor memory deviceTOSHIBA KK·Filed 2015·Granted Feb 14, 2017·1 cites·16 claims
- 1655US7387921B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2005·Granted Jun 17, 2008·2 cites·20 claims
- 1748US8216942B2Method for manufacturing semiconductor deviceHASEGAWA MAKOTO·Filed 2008·Granted Jul 10, 2012·0 cites·20 claims
- 1848US8088689B2Method of fabricating semiconductor deviceKIKUTANI KEISUKE·Filed 2009·Granted Jan 3, 2012·0 cites·19 claims
- 1948US2009096007A1Semiconductor memory device and method of manufacturing the sameOMURA MITSUHIRO·Filed 2008·Application pending·0 cites
- 2046US8178913B2Semiconductor device and method for manufacturing sameMURAKOSHI ATSUSHI·Filed 2010·Granted May 15, 2012·0 cites·8 claims
- 2144US2014284308A1Plasma etching method and plasma etching apparatusTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2242US9887098B2Method for manufacturing integrated circuit deviceTOSHIBA MEMORY CORP·Filed 2015·Granted Feb 6, 2018·0 cites·11 claims
- 2342US8460997B2Semiconductor memory device and method of manufacturing the sameOMURA MITSUHIRO·Filed 2011·Granted Jun 11, 2013·0 cites·6 claims
- 2441US2013234235A1Method for manufacturing semiconductor memory device and semiconductor memory deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2540US2013234232A1Method for manufacturing semiconductor device and semiconductor deviceYAHASHI KATSUNORI·Filed 2012·Application pending·0 cites
- 2638US8062938B2Semiconductor device and method of fabricating the sameNISHIYAMA NOBUYASU·Filed 2010·Granted Nov 22, 2011·0 cites·7 claims
- 2738US2006137988A1Semiconductor manufacturing apparatus and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2005·Application pending·0 cites
- 2835US2010323505A1Method for manufacturing semiconductor deviceISHIKAWA MASAO·Filed 2010·Application pending·0 cites
- 2934US2006128093A1Method of manufacturing semiconductor deviceTAKENAKA KEIICHI·Filed 2005·Application pending·0 cites
- 3034US2011147942A1Method of manufacturing semiconductor memory device and semiconductor memory deviceTOSHIBA KK·Filed 2010·Application pending·0 cites
- 3133US2011223769A1Method of fabricating a semiconductor deviceKO NIKKA·Filed 2011·Application pending·0 cites
- 3233US2006231877A1Semiconductor deviceTAKENAKA KEIICHI·Filed 2005·Application pending·0 cites
- 3332US2004188739A1Semiconductor device including trench capacitor and manufacturing method of the sameFiled 2004·Application pending·0 cites
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