Inventor · disambiguated record
Hidekazu Mimura
Also filed as: MIMURA HIDEKAZU
5 granted patents·3 pending applications·5 citations·filing 2007–2022
67Inventor score
Top patents by PatentIndex Score
8 records- 0159US9892811B2Optical design method for X-ray focusing system using rotating mirror, and X-ray focusing systemUNIV TOKYO·Filed 2014·Granted Feb 13, 2018·1 cites·5 claims
- 0256US8744046B2Method and apparatus of precisely measuring intensity profile of X-ray nanobeamYAMAUCHI KAZUTO·Filed 2009·Granted Jun 3, 2014·2 cites·9 claims
- 0351US7936860B2X-ray condensing method and its device using phase restoration methodJTEC CORP·Filed 2007·Granted May 3, 2011·1 cites·9 claims
- 0447US7616324B2Ultra precision profile measuring methodJTEC CORP·Filed 2007·Granted Nov 10, 2009·1 cites·6 claims
- 0546US2024112826A1Method for designing mirror and astigmatism control mirror having reflecting surface satisfying design formula in said designing methodUNIV TOKYO·Filed 2022·Application pending·0 cites
- 0645US2021331283A1Local polishing method, local polishing device, and corrective polishing apparatus using the local polishing deviceUNIV TOKYO·Filed 2019·Application pending·0 cites
- 0745US2024069331A1Method for designing mirror and astigmatism control mirror having reflecting surface satisfying design formula in said designing methodUNIV TOKYO·Filed 2022·Application pending·0 cites
- 0841US8000443B2High precision posture control method of X-ray mirrorJTEC CORP·Filed 2007·Granted Aug 16, 2011·0 cites·13 claims
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