Inventor · disambiguated record
Stefan Florek
Also filed as: FLOREK STEFAN
14 granted patents·143 citations·filing 1985–2010
92Inventor score
Technology areasG01J
Files withGES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV2JENOPTIK JENA GMBH2ZENTRALINSTITUT FUER OPTIK UND2AKAD WISSENSCHAFTEN DDR1BECKER-ROSS HELMUT1
Top patents by PatentIndex Score
14 records- 0191US7876435B2Method for determining background and correction of broadband backgroundLEIBNIZ INST FUR ANALYTISCHE WISSENSCHAFTEN ISAS E V·Filed 2008·Granted Jan 25, 2011·33 cites·5 claims
- 0257US5189486AEchelle polychromatorZENTRALINSTITUT FUER OPTIK UND·Filed 1991·Granted Feb 23, 1993·22 cites·5 claims
- 0356US7319519B2Method for the analysis of echelle spectraGES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV·Filed 2001·Granted Jan 15, 2008·6 cites·25 claims
- 0455US7804593B2Echelle spectometer with improved use of the detector by means of two spectrometer arrangementsLEIBNIZ INST FUR ANALYTISCHE W·Filed 2005·Granted Sep 28, 2010·5 cites·13 claims
- 0555US4856898AAdjustable echelle spectrometer arrangement and method for its adjustmentJENOPTIK JENA GMBH·Filed 1988·Granted Aug 15, 1989·18 cites·6 claims
- 0652US8873048B2Spectrometer arrangementFLOREK STEFAN·Filed 2010·Granted Oct 28, 2014·1 cites·12 claims
- 0752US7215422B2Assembly and method for wavelength calibration in an echelle spectrometerGES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV·Filed 2003·Granted May 8, 2007·5 cites·13 claims
- 0849US4690559AOptical system for spectral analysis devicesJENOPTIK JENA GMBH·Filed 1985·Granted Sep 1, 1987·13 cites·16 claims
- 0947US8681329B2Echelle spectrometer arrangement using internal predispersionBECKER-ROΒ HELMUT·Filed 2010·Granted Mar 25, 2014·1 cites·13 claims
- 1046US4940325ADevice for the investigation of highly resolved partial spectra of an echelle spectrumAKAD WISSENSCHAFTEN DDR·Filed 1989·Granted Jul 10, 1990·14 cites·5 claims
- 1144US6717670B2High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profileGES FOERDERUNG SPEKTROCHEMIE·Filed 2000·Granted Apr 6, 2004·2 cites·20 claims
- 1244US5448351AEchelle polychromatorBODENSEEWERK PERKIN ELMER CO·Filed 1992·Granted Sep 5, 1995·11 cites·7 claims
- 1339US5182609ASpectrometerZENTRALINSTITUT FUER OPTIK UND·Filed 1991·Granted Jan 26, 1993·12 cites·4 claims
- 1436US8102527B2Spectrometer assemblyBECKER-ROSS HELMUT·Filed 2008·Granted Jan 24, 2012·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →