Inventor · disambiguated record
Narender Rana
Also filed as: RANA NARENDER · RANA NARENDER N
6 granted patents·3 pending applications·68 citations·filing 2004–2014
82Inventor score
Top patents by PatentIndex Score
9 records- 0188US7119333B2Ion detector for ion beam applicationsIBM·Filed 2004·Granted Oct 10, 2006·34 cites·20 claims
- 0287US7351966B1High-resolution optical channel for non-destructive navigation and processing of integrated circuitsIBM·Filed 2006·Granted Apr 1, 2008·11 cites·20 claims
- 0381US9330985B2Automated hybrid metrology for semiconductor device fabricationVAID ALOK·Filed 2012·Granted May 3, 2016·11 cites·19 claims
- 0481US9262819B1System and method for estimating spatial characteristics of integrated circuitsGLOBALFOUNDRIES INC·Filed 2014·Granted Feb 16, 2016·6 cites·20 claims
- 0575US8030157B1Liner protection in deep trench etchingIBM·Filed 2010·Granted Oct 4, 2011·4 cites·8 claims
- 0668US7781733B2In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniquesIBM·Filed 2007·Granted Aug 24, 2010·2 cites·20 claims
- 0746US2014073114A1In-situ active wafer charge screening by conformal groundingGLOBALFOUNDRIES INC·Filed 2013·Application pending·0 cites
- 0840US2013200501A1In-situ active wafer charge screening by conformal groundingCEN CHENG·Filed 2012·Application pending·0 cites
- 0931US2013203188A1Hybrid metrology for semiconductor devicesVAID ALOK·Filed 2012·Application pending·0 cites
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