Inventor · disambiguated record
Hideyuki Wakai
Also filed as: WAKAI HIDEYUKI
11 granted patents·2 pending applications·554 citations·filing 1981–2011
92Inventor score
Top patents by PatentIndex Score
13 records- 0196US5659420AConfocal optical apparatusKOMATSU MFG CO LTD·Filed 1994·Granted Aug 19, 1997·280 cites·9 claims
- 0292US4456960AMethod and device for detecting tool abnormality in machine toolsKOMATSU MFG CO LTD·Filed 1981·Granted Jun 26, 1984·71 cites·19 claims
- 0390US4442493ACutting tool retreat and return for workpiece protection upon abnormality occurrence in a preprogrammed machine toolKOMATSU MFG CO LTD·Filed 1981·Granted Apr 10, 1984·97 cites·11 claims
- 0465US5629773AThree-dimensional image measuring deviceKOMATSU MFG CO LTD·Filed 1995·Granted May 13, 1997·20 cites·6 claims
- 0563US9121697B2Wear amount measuring device, wear amount measuring method, wear amount measuring program and storage mediumMARUMOTO SHIGETO·Filed 2011·Granted Sep 1, 2015·4 cites·20 claims
- 0662US5793638AWork instruction system and conveyance control system in production lineKOMATSU MFG CO LTD·Filed 1996·Granted Aug 11, 1998·21 cites·2 claims
- 0755US5568261AThree-dimensional image measuring deviceKOMATSU MFG CO LTD·Filed 1995·Granted Oct 22, 1996·16 cites·3 claims
- 0854US5506703AThree-dimensional image display deviceKOMATSU MFG CO LTD·Filed 1994·Granted Apr 9, 1996·16 cites·6 claims
- 0954US5430560AThree-dimensional image display deviceKOMATSU MFG CO LTD·Filed 1993·Granted Jul 4, 1995·15 cites·5 claims
- 1049US5448360AThree-dimensional image measuring deviceKOMATSU MFG CO LTD·Filed 1993·Granted Sep 5, 1995·9 cites·5 claims
- 1141US2003041071A1Database Management system and databaseKOMATSU MFG CO LTD·Filed 2002·Application pending·0 cites
- 1238US2007009010A1Wafer temperature measuring method and apparatusSHIO KOJI·Filed 2006·Application pending·0 cites
- 1335US5559603Athree-dimensional image measuring deviceKOMATSU MFG CO LTD·Filed 1995·Granted Sep 24, 1996·5 cites·3 claims
Join the waitlist — get patent alerts
Get an alert when Hideyuki Wakai files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →