Inventor · disambiguated record
Kwangeun Kim
Also filed as: KIM KWANGEUN
5 granted patents·6 pending applications·2 citations·filing 2011–2025
63Inventor score
Top patents by PatentIndex Score
11 records- 0175US2024385220A1Test apparatus and test method thereofRYU SUNGYOON·Filed 2024·Application pending·0 cites
- 0275US2025341540A1Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0373US10217897B1Aluminum nitride-aluminum oxide layers for enhancing the efficiency of group III-nitride light-emitting devicesWISCONSIN ALUMNI RES FOUND·Filed 2017·Granted Feb 26, 2019·2 cites·12 claims
- 0469US12385946B2Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·8 claims
- 0568US12092656B2Test apparatus and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 17, 2024·0 cites·20 claims
- 0667US2025316443A1Scanning electron microscope (sem) image improving methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0762US2024192154A1Pattern inspection apparatus and pattern inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0852US12362138B2Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 0952US2024242317A1Scanning electron microscope image distortion correction method, and semiconductor manufacturing method using the correction methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1037US11428645B2Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 30, 2022·0 cites·20 claims
- 1125US2012155567A1Data transmission apparatus and transmission method thereofKIM KWANGEUN·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →