Inventor · disambiguated record
Tsuyoshi Oonishi
Also filed as: OONISHI TSUYOSHI
3 granted patents·1 pending application·1 citations·filing 2017–2017
46Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH SCIENCE CORP4
Top patents by PatentIndex Score
4 records- 0166US10056227B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Aug 21, 2018·1 cites·19 claims
- 0243US9934940B2Control device, charged particle beam apparatus, program and method for producing processed productHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Apr 3, 2018·0 cites·8 claims
- 0337US9947506B2Sample holder and focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Apr 17, 2018·0 cites·8 claims
- 0432US2017271119A1Composite charged particle beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →