Inventor · disambiguated record
Jarkko Antila
Also filed as: ANTILA JARKKO
11 granted patents·4 pending applications·81 citations·filing 2006–2018
89Inventor score
Top patents by PatentIndex Score
15 records- 0190US7305888B2Optical interferometric pressure sensorINFICON GMBH·Filed 2006·Granted Dec 11, 2007·25 cites·24 claims
- 0284US8780356B1Method for determining calibration parameters for a spectrometerTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2013·Granted Jul 15, 2014·9 cites·12 claims
- 0383US7707891B2Optical interferometric pressure sensorINFICON GMBH·Filed 2008·Granted May 4, 2010·9 cites·17 claims
- 0482US8654347B2Micromechanical tunable Fabry-Perot interferometer arrangement and a method for producing the sameTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2013·Granted Feb 18, 2014·5 cites·10 claims
- 0579US10545049B2Method for stabilizing a spectrometer using single spectral notchSPECTRAL ENGINES OY·Filed 2015·Granted Jan 28, 2020·3 cites·14 claims
- 0678US7614308B2Diaphragm pressure measuring cell arrangementINFICON GMBH·Filed 2008·Granted Nov 10, 2009·15 cites·22 claims
- 0777US9268144B2Method for producing a mirror plate for Fabry-Perot interferometer, and a mirror plate produced by the methodTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2014·Granted Feb 23, 2016·5 cites·8 claims
- 0869US7500300B2Optical interferometric pressure sensor manufacturing methodINFICON GMBH·Filed 2007·Granted Mar 10, 2009·7 cites·24 claims
- 0968US9772228B2Device and method for optical measurement of a targetTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2014·Granted Sep 26, 2017·2 cites·13 claims
- 1053US9588334B2Fabry-perot interferometer and a method for producing the same with decreased bendingTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2013·Granted Mar 7, 2017·1 cites·10 claims
- 1150US11698303B2Method and system for analysing a chemical composition of a target using a Fabry-Perot interferometerSPECTRAL ENGINES OY·Filed 2018·Granted Jul 11, 2023·0 cites·11 claims
- 1237US2012206733A1Method and system for the thickness data determination of ultrathin optical films in-situANTILA JARKKO·Filed 2010·Application pending·0 cites
- 1329US2017322085A1Optical measurement method and systemSPECTRAL ENGINES OY·Filed 2015·Application pending·0 cites
- 1429US2017350760A1Optical measurement systemSPECTRAL ENGINES OY·Filed 2015·Application pending·0 cites
- 1525US2017138790A1A method for determining the spectral scale of a spectrometer and apparatusSPECTRAL ENGINES OY·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →