Inventor · disambiguated record
Hideaki Harakawa
Also filed as: HARAKAWA HIDEAKI
14 granted patents·8 pending applications·91 citations·filing 1997–2019
90Inventor score
Top patents by PatentIndex Score
22 records- 0197US8716818B2Magnetoresistive element and method of manufacturing the sameYOSHIKAWA MASATOSHI·Filed 2012·Granted May 6, 2014·49 cites·20 claims
- 0286US10833096B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Nov 10, 2020·4 cites·9 claims
- 0382US10734406B2Semiconductor memory device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2019·Granted Aug 4, 2020·3 cites·20 claims
- 0468US10957702B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 23, 2021·1 cites·9 claims
- 0567US8232197B2Method of manufacturing a semiconductor device from which damage layers and native oxide films in connection holes have been removedHONDA MAKOTO·Filed 2009·Granted Jul 31, 2012·2 cites·10 claims
- 0667US7605076B2Method of manufacturing a semiconductor device from which damage layers and native oxide films in connection holes have been removedTOSHIBA KK·Filed 2006·Granted Oct 20, 2009·2 cites·10 claims
- 0757US6339237B1Semiconductor device having a memory cell region and peripheral circuit region and method of manufacturing the sameTOSHIBA KK·Filed 1999·Granted Jan 15, 2002·16 cites·7 claims
- 0854US7858465B2Semiconductor device comprising transistor and capacitor and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Dec 28, 2010·1 cites·17 claims
- 0953US2011248368A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2011·Application pending·0 cites
- 1052US8053268B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Nov 8, 2011·0 cites·7 claims
- 1146US6551882B2Semiconductor device manufacturing method permitting suppression of leak current through the PN junctionTOSHIBA KK·Filed 2001·Granted Apr 22, 2003·3 cites·6 claims
- 1244US9035402B2Semiconductor memory deviceASAO YOSHIAKI·Filed 2013·Granted May 19, 2015·0 cites·20 claims
- 1343US7541295B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Jun 2, 2009·0 cites·9 claims
- 1443US7479433B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Jan 20, 2009·0 cites·14 claims
- 1542US2016322379A1Semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
- 1641US5913143AMethod of making a multilayer interconnection of semiconductor device using plugTOSHIBA KK·Filed 1997·Granted Jun 15, 1999·10 cites·8 claims
- 1741US2010140719A1Semiconductor device and manufacturing method thereofYAMASAKI HIROYUKI·Filed 2009·Application pending·0 cites
- 1841US2013316536A1Semiconductor manufacturing device and semiconductor device manufacturing methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1939US2012248517A1Magnetic memory deviceHARAKAWA HIDEAKI·Filed 2011·Application pending·0 cites
- 2036US2006019438A1Semiconductor device and method of manufacturing the sameHARAKAWA HIDEAKI·Filed 2005·Application pending·0 cites
- 2136US2007120185A1Semiconductor device manufacturing method and semiconductor deviceKOMUKAI TOSHIAKI·Filed 2006·Application pending·0 cites
- 2235US2005191817A1Semiconductor device and method of fabricating the sameFiled 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hideaki Harakawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →