Inventor · disambiguated record
Mincheol Kang
Also filed as: KANG MINCHEOL
6 granted patents·5 pending applications·1 citations·filing 2020–2025
65Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0178US11699227B2Method of verifying error of optical proximity correction modelSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 11, 2023·1 cites·20 claims
- 0261US12487954B2Computer communication device with inter-device data copyingSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Dec 2, 2025·0 cites·29 claims
- 0355US2025199973A1Networking switch and method with direct memory access based link controlSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0454US2025328072A1Method of correcting an error of a layout of a pattern and method of forming a pattern using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0554US2025224665A1Method of extracting sub-resolution assist feature (sraf) printing contours from scanning electron microscope (sem) image, optical proximity correction (opc) method, and mask manufacturing method including the opc methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0653US12229944B2Defect detection method of deep learning-based semiconductor device and semiconductor element manufacturing method including the defect detection methodSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 18, 2025·0 cites·20 claims
- 0753US2025077407A1Electronic device and method with memory operation mode controlSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0850US2025219896A1Network controller and method of network controlSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0948US12307651B2Method of detecting measurement error of SEM equipment and method of aligning SEM equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 20, 2025·0 cites·18 claims
- 1045US11562934B2Manufacturing method of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 24, 2023·0 cites·20 claims
- 1144US11747721B2Method of forming shape on mask based on deep learning, and mask manufacturing method using the method of forming the shape on maskSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Sep 5, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →