Inventor · disambiguated record
Joost J. Vlassak
Also filed as: VLASSAK JOOST · VLASSAK JOOST J · VLASSAK JOOST JOHAN
10 granted patents·4 pending applications·107 citations·filing 1999–2021
88Inventor score
Top patents by PatentIndex Score
14 records- 0196US9387276B2Interpenetrating networks with covalent and Ionic CrosslinksHARVARD COLLEGE·Filed 2013·Granted Jul 12, 2016·74 cites·40 claims
- 0292US10975205B2Hydrogels with improved mechanical properties below water freezing temperatureHARVARD COLLEGE·Filed 2016·Granted Apr 13, 2021·4 cites·28 claims
- 0388US11033658B2Interpenetrating networks with covalent and ionic crosslinksHARVARD COLLEGE·Filed 2019·Granted Jun 15, 2021·1 cites·12 claims
- 0487US10383980B2Interpenetrating networks with covalent and ionic crosslinksHARVARD COLLEGE·Filed 2016·Granted Aug 20, 2019·4 cites·29 claims
- 0578US2021353830A1Interpenetrating networks with covalent and ionic crosslinksHARVARD COLLEGE·Filed 2021·Application pending·0 cites
- 0676US10591458B2Anisotropic muscular tissue devices with integrated electrical force readoutsHARVARD COLLEGE·Filed 2015·Granted Mar 17, 2020·2 cites·14 claims
- 0774US8265884B2Method to measure the elastic modulus and hardness of thin film on substrate by nanoindentationLI HAN·Filed 2009·Granted Sep 11, 2012·4 cites·7 claims
- 0861US11906454B2Highly sensitive microcalorimeters for cellular bioenergeticsHARVARD COLLEGE·Filed 2017·Granted Feb 20, 2024·0 cites·10 claims
- 0954US7201022B2Systems and methods for filling voids and improving properties of porous thin filmsXEROX CORP·Filed 2005·Granted Apr 10, 2007·1 cites·6 claims
- 1041US2017197392A1Fire Retarding CompositionsHARVARD COLLEGE·Filed 2015·Application pending·0 cites
- 1140US6319727B1Method for manufacturing low stress metallic interconnect lines for use in integrated circuitsNAT SEMICONDUCTOR CORP·Filed 1999·Granted Nov 20, 2001·9 cites·12 claims
- 1238US2007286769A1Parallel nano-differential scanning calorimetryVLASSAK JOOST J·Filed 2007·Application pending·0 cites
- 1335US2003194545A1Systems and methods for filling voids and improving properties of porous thin filmsFiled 2002·Application pending·0 cites
- 1431US6247842B1Method of wafer temperature measurementNAT SEMICONDUCTOR CORP·Filed 1999·Granted Jun 19, 2001·8 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Joost J. Vlassak files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →