Inventor · disambiguated record
Brian Warwick
Also filed as: WARWICK BRIAN · WARWICK BRIAN K
14 granted patents·5 pending applications·119 citations·filing 2001–2018
91Inventor score
Top patents by PatentIndex Score
19 records- 0197US8536889B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2010·Granted Sep 17, 2013·47 cites·20 claims
- 0295US9007082B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2012·Granted Apr 14, 2015·19 cites·29 claims
- 0389US8102184B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2008·Granted Jan 24, 2012·19 cites·57 claims
- 0487US9678106B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2016·Granted Jun 13, 2017·2 cites·20 claims
- 0583US8912811B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2012·Granted Dec 16, 2014·5 cites·21 claims
- 0682US9476936B1Thermal management for microcircuit testing systemJOHNSTECH INT CORP·Filed 2014·Granted Oct 25, 2016·6 cites·7 claims
- 0781US10073117B2Resilient interposer with electrically conductive slide-by pins as part of a microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Sep 11, 2018·1 cites·20 claims
- 0876US8937484B2Microcircuit tester with slideable electrically conductive pinsNELSON JOHN E·Filed 2013·Granted Jan 20, 2015·3 cites·14 claims
- 0971US9297832B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2014·Granted Mar 29, 2016·1 cites·12 claims
- 1068US7567075B2Single latch manual actuator for testing microcircuits, and having a mechanical interlock for controlling opening and closingKOSTUCHOWSKI CORY R·Filed 2006·Granted Jul 28, 2009·7 cites·6 claims
- 1166US10302675B2Electrically conductive pins microcircuit testerJOHNSTECH INT CORP·Filed 2018·Granted May 28, 2019·0 cites·16 claims
- 1262US10877090B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Dec 29, 2020·0 cites·19 claims
- 1354US2015123689A1Electrically Conductive Pins For Microcircuit TesterJOHNSTECH INT CORP·Filed 2015·Application pending·0 cites
- 1453US2013002285A1Electrically Conductive Pins For Microcircuit TesterJOHNSTECH INT CORP·Filed 2012·Application pending·0 cites
- 1552US6889841B2Interface apparatus for reception and delivery of an integrated circuit package from one location to anotherJOHNSTECH INT CORP·Filed 2002·Granted May 10, 2005·8 cites·1 claims
- 1650US2012062261A1Electrically Conductive Pins For Microcircuit TesterNELSON JOHN E·Filed 2011·Application pending·0 cites
- 1749US7994808B2Contact insert for a microcircuit test socketJOHNSTECH INT CORP·Filed 2008·Granted Aug 9, 2011·1 cites·16 claims
- 1836US2008297142A1Contact insert for a microcircuit test socketALLADIO PATRICK J·Filed 2008·Application pending·0 cites
- 1927US2003030458A1Integrated circuit socket with floating alignment memberFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →