Inventor · disambiguated record
Paul J. Grzymkowski
Also filed as: GRZYMKOWSKI PAUL J
11 granted patents·12 citations·filing 2007–2023
84Inventor score
Top patents by PatentIndex Score
11 records- 0194US12266415B1Reliable electronic fuse based storage using error correction codingMARVELL ASIA PTE LTD·Filed 2023·Granted Apr 1, 2025·4 cites·18 claims
- 0287US9881694B2Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2015·Granted Jan 30, 2018·6 cites·20 claims
- 0368US10971243B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 6, 2021·1 cites·20 claims
- 0466US10692584B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Jun 23, 2020·1 cites·16 claims
- 0557US10295592B2Pre-test power-optimized bin reassignment following selective voltage binningGLOBALFOUNDRIES INC·Filed 2017·Granted May 21, 2019·0 cites·17 claims
- 0655US11295829B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 5, 2022·0 cites·19 claims
- 0752US9759767B2Pre-test power-optimized bin reassignment following selective voltage binningGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 12, 2017·0 cites·11 claims
- 0850US10553302B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Feb 4, 2020·0 cites·20 claims
- 0948US7904839B2System and method for controlling access to addressable integrated circuitsIBM·Filed 2007·Granted Mar 8, 2011·0 cites·17 claims
- 1047US9760673B2Application specific integrated circuit (ASIC) test screens and selection of such screensGLOBALFOUNDRIES INC·Filed 2016·Granted Sep 12, 2017·0 cites·20 claims
- 1147US7831936B2Structure for a system for controlling access to addressable integrated circuitsIBM·Filed 2007·Granted Nov 9, 2010·0 cites·4 claims
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