Inventor · disambiguated record
Tao-Yi Fu
Also filed as: FU TAO · FU TAO-YI
36 granted patents·3 pending applications·1,740 citations·filing 1994–2020
98Inventor score
Files withKLA TENCOR CORP14KLA TENCOR TECH CORP12KLA INSTR CORP3SINTAI OPTICAL SHENZHEN CO LTD3ALLWINNER TECHNOLOGY CO LTD1
Top patents by PatentIndex Score
39 records- 0199US5572598AAutomated photomask inspection apparatusKLA INSTR CORP·Filed 1994·Granted Nov 5, 1996·294 cites·49 claims
- 0298US5563702AAutomated photomask inspection apparatus and methodKLA INSTR CORP·Filed 1994·Granted Oct 8, 1996·386 cites·41 claims
- 0397US6363166B1Automated photomask inspection apparatusKLA TENCOR CORP·Filed 2000·Granted Mar 26, 2002·94 cites·32 claims
- 0497US6288780B1High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR TECH CORP·Filed 1997·Granted Sep 11, 2001·207 cites·26 claims
- 0597US6052478AAutomated photomask inspection apparatusKLA TENCOR CORP·Filed 1996·Granted Apr 18, 2000·166 cites·46 claims
- 0696US5737072AAutomated photomask inspection apparatus and methodKLA INSTR CORP·Filed 1996·Granted Apr 7, 1998·221 cites·41 claims
- 0795US7061625B1Method and apparatus using interferometric metrology for high aspect ratio inspectionKLA TENCOR TECH CORP·Filed 2003·Granted Jun 13, 2006·85 cites·55 claims
- 0895US6816249B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2001·Granted Nov 9, 2004·49 cites·35 claims
- 0992US7554655B2High throughput brightfield/darkfield water inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2008·Granted Jun 30, 2009·16 cites·21 claims
- 1092US6867406B1Confocal wafer inspection method and apparatus using fly lens arrangementKLA TENCOR CORP·Filed 2000·Granted Mar 15, 2005·43 cites·32 claims
- 1189US7858911B2Confocal wafer inspection system and methodKLA TENCOR CORP·Filed 2008·Granted Dec 28, 2010·15 cites·19 claims
- 1289US7109458B2Confocal wafer depth scanning inspection methodKLA TENCOR CORP·Filed 2005·Granted Sep 19, 2006·15 cites·20 claims
- 1386US7436503B1Dark field inspection apparatus and methodsKLA TENCOR TECH CORP·Filed 2004·Granted Oct 14, 2008·35 cites·20 claims
- 1486US7164475B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR TECH CORP·Filed 2004·Granted Jan 16, 2007·17 cites·32 claims
- 1585US7535563B1Systems configured to inspect a specimenKLA TENCOR TECH CORP·Filed 2006·Granted May 19, 2009·11 cites·19 claims
- 1684US10324046B1Methods and systems for monitoring a non-defect related characteristic of a patterned waferKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·5 cites·20 claims
- 1783US7924434B2Systems configured to generate output corresponding to defects on a specimenKLA TENCOR TECH CORP·Filed 2006·Granted Apr 12, 2011·8 cites·18 claims
- 1883US7327464B2System and method for coherent optical inspectionKLA TENCOR TECH CORP·Filed 2007·Granted Feb 5, 2008·7 cites·16 claims
- 1982US9989732B1Lens assemblySINTAI OPTICAL SHENZHEN CO LTD·Filed 2017·Granted Jun 5, 2018·4 cites·19 claims
- 2080US8355140B2Systems configured to generate output corresponding to defects on a specimenKLA TENCOR TECH CORP·Filed 2011·Granted Jan 15, 2013·3 cites·12 claims
- 2178US7399950B2Confocal wafer inspection method and apparatus using fly lens arrangementKLA TENCOR CORP·Filed 2006·Granted Jul 15, 2008·6 cites·19 claims
- 2277US7379173B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2004·Granted May 27, 2008·9 cites·25 claims
- 2376US11339218B2Human monoclonal antibodies against LAG3 and uses thereofZHEJIANG SHIMAI PHARMACEUTICAL CO LTD·Filed 2018·Granted May 24, 2022·1 cites·21 claims
- 2476US11314043B2Lens assembly including six lenses of −−++−+ refractive powersSINTAI OPTICAL SHENZHEN CO LTD·Filed 2019·Granted Apr 26, 2022·2 cites·8 claims
- 2575US11187874B2Wide-angle lens assemblySINTAI OPTICAL SHENZHEN CO LTD·Filed 2019·Granted Nov 30, 2021·2 cites·20 claims
- 2675US7209239B2System and method for coherent optical inspectionKLA TENCOR TECH CORP·Filed 2003·Granted Apr 24, 2007·16 cites·43 claims
- 2774US7259844B2High throughput darkfield/brightfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2007·Granted Aug 21, 2007·2 cites·20 claims
- 2874US6584218B2Automated photomask inspection apparatusKLA TENCOR CORP·Filed 2001·Granted Jun 24, 2003·8 cites·1 claims
- 2970US7522275B2High throughput darkfield/brightfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2007·Granted Apr 21, 2009·1 cites·20 claims
- 3069US8384887B2Methods and systems for inspection of a specimen using different inspection parametersKLA TENCOR TECH CORP·Filed 2010·Granted Feb 26, 2013·1 cites·41 claims
- 3168US7738089B2Methods and systems for inspection of a specimen using different inspection parametersKLA TENCOR TECH CORP·Filed 2004·Granted Jun 15, 2010·7 cites·16 claims
- 3264US9625810B2Source multiplexing illumination for mask inspectionWANG DAIMIAN·Filed 2012·Granted Apr 18, 2017·1 cites·17 claims
- 3351US9151718B2Illumination system with time multiplexed sources for reticle inspectionKLA TENCOR CORP·Filed 2013·Granted Oct 6, 2015·0 cites·32 claims
- 3450US7317527B1Spatial light modulator fourier transformKLA TENCOR TECH CORP·Filed 2004·Granted Jan 8, 2008·3 cites·16 claims
- 3539US2019367611A1Monomeric human igg1 fc and bispecific antibodiesCENTRYMED PHARMACEUTICAL INC·Filed 2018·Application pending·0 cites
- 3638US11755168B2Infrared touch display screenSHENZHEN HITEVISION TECH CO LTD·Filed 2020·Granted Sep 12, 2023·0 cites·20 claims
- 3734US10742989B2Variable frame rate encoding method and device based on a still area or a motion areaALLWINNER TECHNOLOGY CO LTD·Filed 2018·Granted Aug 11, 2020·0 cites·4 claims
- 3832US2009233013A1Viewing window and electronic device employing the sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2008·Application pending·0 cites
- 3928US2011294365A1Elastic electrical contactWANG Feng-jun·Filed 2010·Application pending·0 cites
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