Inventor · disambiguated record
Naomichi Chida
Also filed as: CHIDA NAOMICHI
9 granted patents·1 pending application·46 citations·filing 1989–2018
81Inventor score
Top patents by PatentIndex Score
10 records- 0193US9488468B2Displacement sensor, spectral characteristic measuring apparatus, color measuring apparatus, planar measured object quality monitoring apparatus, displacement measuring method, spectral characteristic measuring method, and color measuring methodYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Nov 8, 2016·30 cites·9 claims
- 0273US9170194B2Material property measuring apparatusYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Oct 27, 2015·3 cites·12 claims
- 0352US9605949B2Displacement sensor, spectral characteristic measuring apparatus, color measuring apparatus, planar measured object quality monitoring apparatus, displacement measuring method, spectral characteristic measuring method, and color measuring methodYOKOGAWA ELECTRIC CORP·Filed 2016·Granted Mar 28, 2017·0 cites·2 claims
- 0450US10345231B2Signal detection device and optical characteristics measurement deviceYOKOGAWA ELECTRIC CORP·Filed 2017·Granted Jul 9, 2019·0 cites·20 claims
- 0549US4941138AMethod and an apparatus for measuring optical characteristics of an optical diskNAKAMICHI CORP·Filed 1989·Granted Jul 10, 1990·13 cites·6 claims
- 0644US10481082B2Measuring deviceYOKOGAWA ELECTRIC CORP·Filed 2018·Granted Nov 19, 2019·0 cites·17 claims
- 0743US10634489B2Displacement sensorYOKOGAWA ELECTRIC CORP·Filed 2018·Granted Apr 28, 2020·0 cites·19 claims
- 0843US7692856B2Focus error detecting optical system for a microscopeYOKOGAWA ELECTRIC CORP·Filed 2007·Granted Apr 6, 2010·0 cites·3 claims
- 0942US8823819B2Apparatus for measuring position and shape of pattern formed on sheetICHIZAWA YASUSHI·Filed 2011·Granted Sep 2, 2014·0 cites·4 claims
- 1037US2011273557A1Position measuring systemYOKOGAWA ELECTRIC CORP·Filed 2011·Application pending·0 cites
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