Inventor · disambiguated record
Alvin W. Strong
Also filed as: STRONG ALVIN W · STRONG ALVIN WAYNE
35 granted patents·2 pending applications·472 citations·filing 1996–2013
97Inventor score
Top patents by PatentIndex Score
37 records- 0196US8053814B2On-chip embedded thermal antenna for chip coolingIBM·Filed 2009·Granted Nov 8, 2011·44 cites·16 claims
- 0289US8138573B2On-chip heater and methods for fabrication thereof and use thereofCANNON ETHAN H·Filed 2010·Granted Mar 20, 2012·10 cites·16 claims
- 0389US6750530B1Semiconductor antifuse with heating elementIBM·Filed 2003·Granted Jun 15, 2004·57 cites·20 claims
- 0488US6762966B1Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistorIBM·Filed 2003·Granted Jul 13, 2004·55 cites·17 claims
- 0587US6603321B2Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiringIBM·Filed 2001·Granted Aug 5, 2003·49 cites·26 claims
- 0686US7096450B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2003·Granted Aug 22, 2006·41 cites·18 claims
- 0783US7704847B2On-chip heater and methods for fabrication thereof and use thereofIBM·Filed 2006·Granted Apr 27, 2010·9 cites·9 claims
- 0883US7315075B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2005·Granted Jan 1, 2008·8 cites·12 claims
- 0983US7298161B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2005·Granted Nov 20, 2007·10 cites·7 claims
- 1082US8120356B2Measurement methodology and array structure for statistical stress and test of reliabilty structuresAGARWAL KANAK B·Filed 2009·Granted Feb 21, 2012·11 cites·25 claims
- 1174US6352902B1Process of forming a capacitor on a substrateIBM·Filed 2000·Granted Mar 5, 2002·14 cites·8 claims
- 1273US7723200B2Electrically tunable resistor and related methodsIBM·Filed 2007·Granted May 25, 2010·5 cites·14 claims
- 1373US7388274B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2007·Granted Jun 17, 2008·4 cites·13 claims
- 1472US8217671B2Parallel array architecture for constant current electro-migration stress testingAGARWAL KANAK B·Filed 2009·Granted Jul 10, 2012·6 cites·19 claims
- 1572US7868640B2Array-based early threshold voltage recovery characterization measurementIBM·Filed 2008·Granted Jan 11, 2011·6 cites·20 claims
- 1672US5898706AStructure and method for reliability stressing of dielectricsIBM·Filed 1997·Granted Apr 27, 1999·34 cites·20 claims
- 1767US5899724AMethod for fabricating a titanium resistorIBM·Filed 1996·Granted May 4, 1999·26 cites·14 claims
- 1866US8555216B2Structure for electrically tunable resistorIBEN ICHO E T·Filed 2008·Granted Oct 8, 2013·6 cites·16 claims
- 1963US7512506B2IC chip stress testingIBM·Filed 2007·Granted Mar 31, 2009·5 cites·14 claims
- 2062US7064414B2Heater for annealing trapped charge in a semiconductor deviceIBM·Filed 2004·Granted Jun 20, 2006·10 cites·29 claims
- 2161US6252275B1Silicon-on-insulator non-volatile random access memory deviceIBM·Filed 1999·Granted Jun 26, 2001·20 cites·25 claims
- 2257US6088258AStructures for reduced topography capacitorsIBM·Filed 1998·Granted Jul 11, 2000·14 cites·12 claims
- 2354US8018017B2Thermo-mechanical cleavable structureIBM·Filed 2005·Granted Sep 13, 2011·1 cites·17 claims
- 2454US7023041B2Trench capacitor vertical structureIBM·Filed 2003·Granted Apr 4, 2006·6 cites·17 claims
- 2553US6159787AStructures and processes for reduced topography trench capacitorsIBM·Filed 1998·Granted Dec 12, 2000·15 cites·11 claims
- 2652US7791169B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2008·Granted Sep 7, 2010·0 cites·15 claims
- 2750US8178434B2On-chip embedded thermal antenna for chip coolingCHEN FEN·Filed 2011·Granted May 15, 2012·0 cites·15 claims
- 2849US6743655B2Negative differential resistance reoxidized nitride silicon-based photodiode and methodIBM·Filed 2002·Granted Jun 1, 2004·2 cites·8 claims
- 2948US9404960B2On chip bias temperature instability characterization of a semiconductor deviceIBM·Filed 2013·Granted Aug 2, 2016·0 cites·20 claims
- 3047US8035200B2Neutralization of trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2010·Granted Oct 11, 2011·0 cites·16 claims
- 3147US7736915B2Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2006·Granted Jun 15, 2010·0 cites·8 claims
- 3247US7511378B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2006·Granted Mar 31, 2009·0 cites·3 claims
- 3346US6445021B1Negative differential resistance reoxidized nitride silicon-based photodiode and methodIBM·Filed 2000·Granted Sep 3, 2002·1 cites·10 claims
- 3446US6333239B1Processes for reduced topography capacitorsIBM·Filed 2000·Granted Dec 25, 2001·2 cites·24 claims
- 3542US6891359B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2003·Granted May 10, 2005·1 cites·11 claims
- 3637US2009121259A1Paired magnetic tunnel junction to a semiconductor field-effect transistorIBEN ICKO E T·Filed 2007·Application pending·0 cites
- 3733US2002027681A1Gate stack process for high reliability dual oxide CMOS devices and circuitsIBM·Filed 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Alvin W. Strong files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →