Inventor · disambiguated record
Mami Konomi
Also filed as: KONOMI MAMI
15 granted patents·20 citations·filing 2011–2018
87Inventor score
Top patents by PatentIndex Score
15 records- 0183US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 0276US9472375B2Charged particle beam device, sample stage unit, and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 18, 2016·3 cites·15 claims
- 0371US10020163B2Charged particle beam apparatus, specimen observation system and operation programHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 10, 2018·1 cites·18 claims
- 0466US9443694B2Charged particle beam apparatus, specimen observation system and operation programHITACHI HIGH TECH CORP·Filed 2013·Granted Sep 13, 2016·1 cites·25 claims
- 0566US9086343B2Methods for observing samples and preprocessing thereofHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 21, 2015·2 cites·13 claims
- 0660US9236217B2Inspection or observation apparatus and sample inspection or observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 12, 2016·0 cites·3 claims
- 0759US10808312B2Charged particle device and wiring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 20, 2020·0 cites·14 claims
- 0854US9963776B2Charged particle device and wiring methodHITACHI HIGH TECH CORP·Filed 2013·Granted May 8, 2018·0 cites·8 claims
- 0952USD774045SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 13, 2016·8 cites·1 claims
- 1049US9466457B2Observation apparatus and optical axis adjustment methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 11, 2016·0 cites·16 claims
- 1148US9558912B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 31, 2017·0 cites·13 claims
- 1248US9202668B2Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimenHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 1, 2015·0 cites·17 claims
- 1342US8698079B2Method for scanning electron microscope observation of sample floating on liquid surfaceSHIONO MASAMICHI·Filed 2011·Granted Apr 15, 2014·0 cites·6 claims
- 1439US9058957B2Charged particle beam apparatusSHIGETO KUNJI·Filed 2012·Granted Jun 16, 2015·0 cites·8 claims
- 1538US9355817B2Ion milling device and ion milling processing methodWATANABE SHUNYA·Filed 2011·Granted May 31, 2016·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →