Inventor · disambiguated record

Bu-Yeal Jung

Also filed as: JUNG BU-YEAL

1 granted patent·0 citations·filing 2006–2006

11Inventor score

Technology areasG11C

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0127US7418638B2Semiconductor memory device and method for testing memory cells using several different test data patternsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 26, 2008·0 cites·17 claims

Join the waitlist — get patent alerts

Get an alert when Bu-Yeal Jung files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →