Inventor · disambiguated record
Hiroya Shimizu
Also filed as: SHIMIZU HIROYA
21 granted patents·257 citations·filing 1997–2007
96Inventor score
Top patents by PatentIndex Score
21 records- 0189US6211576B1Semiconductor deviceHITACHI LTD·Filed 1999·Granted Apr 3, 2001·62 cites·17 claims
- 0287US7823096B2Inductance analysis system and method and program thereforELPIDA MEMORY INC·Filed 2006·Granted Oct 26, 2010·17 cites·9 claims
- 0382US7119446B2Semiconductor deviceHITACHI LTD·Filed 2006·Granted Oct 10, 2006·6 cites·9 claims
- 0480US7345892B2Semiconductor device, noise reduction method, and shield coverNEC CORP·Filed 2005·Granted Mar 18, 2008·9 cites·18 claims
- 0579US5838549AMemory module and an IC cardHITACHI LTD·Filed 1997·Granted Nov 17, 1998·46 cites·10 claims
- 0678US6326699B2Semiconductor deviceHITACHI LTD·Filed 2000·Granted Dec 4, 2001·15 cites·1 claims
- 0777US6531785B2Semiconductor deviceHITACHI LTD·Filed 2001·Granted Mar 11, 2003·15 cites·18 claims
- 0873US7030478B2Semiconductor deviceRENESAS TECH CORP·Filed 2005·Granted Apr 18, 2006·3 cites·5 claims
- 0970US6828810B2Semiconductor device testing apparatus and method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·14 cites·13 claims
- 1069US6784533B2Semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Aug 31, 2004·9 cites·16 claims
- 1169US6614246B1Probe structureHITACHI LTD·Filed 2000·Granted Sep 2, 2003·11 cites·16 claims
- 1268US6864568B2Packaging device for holding a plurality of semiconductor devices to be inspectedRENESAS TECH CORP·Filed 2002·Granted Mar 8, 2005·10 cites·16 claims
- 1365US6882039B2Semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Apr 19, 2005·7 cites·9 claims
- 1461US8362614B2Fine pitch grid array type semiconductor deviceELPIDA MEMORY INC·Filed 2005·Granted Jan 29, 2013·2 cites·11 claims
- 1560US6977514B2Probe structureHITACHI LTD·Filed 2003·Granted Dec 20, 2005·6 cites·5 claims
- 1658US7681154B2Method for designing device, system for aiding to design device, and computer program product thereforELPIDA MEMORY INC·Filed 2007·Granted Mar 16, 2010·1 cites·47 claims
- 1757US6955870B2Method of manufacturing a semiconductor deviceHITACHI LTD·Filed 2002·Granted Oct 18, 2005·6 cites·9 claims
- 1857US6952110B2Testing apparatus for carrying out inspection of a semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Oct 4, 2005·6 cites·4 claims
- 1956US6864695B2Semiconductor device testing apparatus and semiconductor device manufacturing method using itRENESAS TECH CORP·Filed 2001·Granted Mar 8, 2005·5 cites·7 claims
- 2055US6465264B1Method for producing semiconductor device and apparatus usable thereinHITACHI LTD·Filed 2000·Granted Oct 15, 2002·4 cites·15 claims
- 2148US6885208B2Semiconductor device and test device for sameRENESAS TECH CORP·Filed 2002·Granted Apr 26, 2005·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →