Inventor · disambiguated record
Shigehisa Yamamoto
Also filed as: YAMAMOTO SHIGEHISA
17 granted patents·5 pending applications·426 citations·filing 1987–2025
95Inventor score
Top patents by PatentIndex Score
22 records- 0195US6099957APlate-like ferrite particles with magnetoplumbite structure and magnetic card using the sameTODA KOGYO CORP·Filed 1999·Granted Aug 8, 2000·110 cites·13 claims
- 0283US5900735ADevice for evaluating reliability of interconnect wiresMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 4, 1999·73 cites·12 claims
- 0382US6127837AMethod of testing semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Oct 3, 2000·50 cites·6 claims
- 0478US10858757B2Silicon carbide epitaxial substrate and silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Dec 8, 2020·2 cites·8 claims
- 0576US6470479B1Method of verifying semiconductor integrated circuit reliability and cell library databaseMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 22, 2002·24 cites·14 claims
- 0671US5198138ASpherical ferrite particles and ferrite resin composite for bonded magnetic coreTODA KOGYO CORP·Filed 1991·Granted Mar 30, 1993·24 cites·10 claims
- 0764US5876819ACrystal orientation detectable semiconductor substrate, and methods of manufacturing and using the sameMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 2, 1999·32 cites·9 claims
- 0861US6037794ASemiconductor device testing apparatus and testing method thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 14, 2000·21 cites·17 claims
- 0958US6372528B1Burn-in method and burn-in deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 16, 2002·10 cites·6 claims
- 1054US2024387201A1Semiconductor manufacturing apparatusMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1153US5605753AMagneto-plumbite ferrite particles for magnetic card, process for producing the same, and magnetic card using the sameTODA KOGYO CORP·Filed 1994·Granted Feb 25, 1997·9 cites·6 claims
- 1252US6404219B1Burn-in test method for a semiconductor chip and burn-in test apparatus thereforMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jun 11, 2002·16 cites·12 claims
- 1352US5968248AHeat-resistant inorganic pigment and process for producing the sameGEN OF AGENCY OF IND SCIENCE·Filed 1997·Granted Oct 19, 1999·13 cites·5 claims
- 1451US2024055306A1Manufacturing method for silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2023·Application pending·0 cites
- 1548US6024478ADesign aiding apparatus and method for designing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 15, 2000·21 cites·18 claims
- 1648US2025372436A1Semiconductor manufacturing apparatus and method for manufacturing semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 1745US9874596B2Method for manufacturing silicon carbide semiconductor apparatus, and energization test apparatusMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Jan 23, 2018·0 cites·12 claims
- 1843US4828916APlate-like magnetoplumbite type ferrite particles for magnetic recording and magnetic recording media using the sameTODA KOGYO CORP·Filed 1987·Granted May 9, 1989·9 cites·6 claims
- 1942US6017631APlate-like ferrite particles with magnetoplumbite structure and magnetic card using the sameTODA KOGYO CORP·Filed 1998·Granted Jan 25, 2000·7 cites·11 claims
- 2039US2010193972A1Spherical sintered ferrite particles, resin composition for semiconductor encapsulation comprising them and semiconductor devices produced by using the sameNITTO DENKO CORP·Filed 2006·Application pending·0 cites
- 2136US5696398AInput protection circuitMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Dec 9, 1997·5 cites·9 claims
- 2226US2002009120A1Burn-in system and burn-in methodMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →