Inventor · disambiguated record
Vladimir Dribinski
Also filed as: DRIBINSKI VLADIMIR · DRIBINSKI VLADIMIR L
28 granted patents·5 pending applications·356 citations·filing 2007–2021
97Inventor score
Top patents by PatentIndex Score
33 records- 0199US8929406B2193NM laser and inspection systemKLA TENCOR CORP·Filed 2014·Granted Jan 6, 2015·63 cites·26 claims
- 0297US9529182B2193nm laser and inspection systemKLA TENCOR CORP·Filed 2014·Granted Dec 27, 2016·33 cites·3 claims
- 0397US9461435B2Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon populationKLA TENCOR CORP·Filed 2015·Granted Oct 4, 2016·13 cites·11 claims
- 0497US8873596B2Laser with high quality, stable output beam, and long life high conversion efficiency non-linear crystalDRIBINSKI VLADIMIR·Filed 2012·Granted Oct 28, 2014·56 cites·15 claims
- 0596US9748729B2183NM laser and inspection systemKLA TENCOR CORP·Filed 2015·Granted Aug 29, 2017·14 cites·13 claims
- 0696US9608399B2193 nm laser and an inspection system using a 193 nm laserKLA TENCOR CORP·Filed 2014·Granted Mar 28, 2017·21 cites·18 claims
- 0796US9459215B2Passivation of nonlinear optical crystalsKLA TENCOR CORP·Filed 2016·Granted Oct 4, 2016·14 cites·22 claims
- 0896US9250178B2Passivation of nonlinear optical crystalsCHUANG YUNG-HO·Filed 2012·Granted Feb 2, 2016·21 cites·24 claims
- 0995US11180866B2Passivation of nonlinear optical crystalsKLA TENCOR CORP·Filed 2014·Granted Nov 23, 2021·7 cites·20 claims
- 1095US10283366B2Passivation of nonlinear optical crystalsKLA TENCOR CORP·Filed 2016·Granted May 7, 2019·8 cites·15 claims
- 1195US10175555B2183 nm CW laser and inspection systemKLA TENCOR CORP·Filed 2017·Granted Jan 8, 2019·12 cites·35 claims
- 1295US8755417B1Coherent light generation below about two-hundred nanometersDRIBINSKI VLADIMIR L·Filed 2007·Granted Jun 17, 2014·39 cites·15 claims
- 1394US9318869B2193nm laser and inspection systemKLA TENCOR CORP·Filed 2014·Granted Apr 19, 2016·11 cites·20 claims
- 1494US9023152B2CLBO crystal growthDRIBINSKI VLADIMIR L·Filed 2010·Granted May 5, 2015·10 cites·5 claims
- 1593US9413134B2Multi-stage ramp-up annealing for frequency-conversion crystalsKLA TENCOR CORP·Filed 2015·Granted Aug 9, 2016·3 cites·20 claims
- 1693US9059560B2Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon populationKLA TENCOR CORP·Filed 2014·Granted Jun 16, 2015·10 cites·9 claims
- 1792US9097683B2Laser with high quality, stable output beam, and long life high conversion efficiency non-linear crystalKLA TENCOR CORP·Filed 2014·Granted Aug 4, 2015·3 cites·14 claims
- 1889US9419407B2Laser assembly and inspection system using monolithic bandwidth narrowing apparatusKLA TENCOR CORP·Filed 2015·Granted Aug 16, 2016·5 cites·27 claims
- 1987US9793673B2Semiconductor inspection and metrology system using laser pulse multiplierCHUANG YUNG-HO·Filed 2012·Granted Oct 17, 2017·5 cites·12 claims
- 2085US10429719B2183 nm CW laser and inspection systemKLA TENCOR CORP·Filed 2018·Granted Oct 1, 2019·2 cites·20 claims
- 2181US10199149B2183NM laser and inspection systemKLA TENCOR CORP·Filed 2017·Granted Feb 5, 2019·2 cites·24 claims
- 2279US9972959B2Semiconductor inspection and metrology system using laser pulse multiplierKLA TENCOR CORP·Filed 2016·Granted May 15, 2018·2 cites·13 claims
- 2373US12152316B1Passivation of nonlinear optical crystalsKLA CORP·Filed 2021·Granted Nov 26, 2024·0 cites·20 claims
- 2473US8711896B2Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon populationDRIBINSKI VLADIMIR·Filed 2010·Granted Apr 29, 2014·2 cites·10 claims
- 2569US10439355B2193nm laser and inspection systemKLA TENCOR CORP·Filed 2018·Granted Oct 8, 2019·0 cites·7 claims
- 2665US11227770B2Passivation of nonlinear optical crystalsKLA TENCOR CORP·Filed 2019·Granted Jan 18, 2022·0 cites·16 claims
- 2765US9935421B2193nm laser and inspection systemKLA TENCOR CORP·Filed 2016·Granted Apr 3, 2018·0 cites·24 claims
- 2861US10193293B2Semiconductor inspection and metrology system using laser pulse multiplierKLA TENCOR CORP·Filed 2018·Granted Jan 29, 2019·0 cites·8 claims
- 2961US2016365693A1Inspection System Using 193nm LaserKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 3059US2017229829A1Inspection System Using 193nm LaserKLA TENCOR CORP·Filed 2017·Application pending·0 cites
- 3154US2013313440A1Solid-State Laser And Inspection System Using 193nm LaserKLA TENCOR CORP·Filed 2013·Application pending·0 cites
- 3242US2019056637A1In-Situ Passivation for Nonlinear Optical CrystalsKLA TENCOR CORP·Filed 2018·Application pending·0 cites
- 3340US2013077086A1Solid-State Laser And Inspection System Using 193nm LaserCHUANG YUNG-HO·Filed 2012·Application pending·0 cites
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