Inventor · disambiguated record
Seok Jin Joo
Also filed as: JOO SEOK JIN
24 granted patents·3 pending applications·191 citations·filing 2001–2018
95Inventor score
Top patents by PatentIndex Score
27 records- 0194US7304894B2Non-volatile memory device and method of preventing hot electron program disturb phenomenonHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Dec 4, 2007·30 cites·11 claims
- 0290US7539057B2Erase and program method of flash memory device for increasing program speed of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted May 26, 2009·22 cites·22 claims
- 0389US8031530B2Method of performing read operation of nonvolatile memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Oct 4, 2011·20 cites·28 claims
- 0487US6504765B1Flash memory device and method of erasing the sameHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Jan 7, 2003·44 cites·9 claims
- 0586US8891311B2Semiconductor memory device and method of programming the sameJOO SEOK JIN·Filed 2011·Granted Nov 18, 2014·11 cites·19 claims
- 0683US7518913B2Read method of memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 14, 2009·13 cites·18 claims
- 0779US8966163B2Non-volatile memory device and method for programming the sameSK HYNIX INC·Filed 2012·Granted Feb 24, 2015·5 cites·20 claims
- 0878US8595593B2Nonvolatile memory device having a copy back operation and method of operating the sameJOO SEOK JIN·Filed 2009·Granted Nov 26, 2013·9 cites·20 claims
- 0973US7663918B2Nonvolatile memory device and method of programming/reading the sameHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Feb 16, 2010·4 cites·9 claims
- 1072US11030099B2Data storage apparatus and operating method thereofSK HYNIX INC·Filed 2018·Granted Jun 8, 2021·1 cites·18 claims
- 1171US7990771B2Program method of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 2, 2011·6 cites·6 claims
- 1270US9099193B2Data storage device and operating method thereofSK HYNIX INC·Filed 2013·Granted Aug 4, 2015·4 cites·21 claims
- 1365US7428166B2Non-volatile memory device and method of preventing hot electron program disturb phenomenonHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 23, 2008·4 cites·13 claims
- 1464US7751241B2Read method of memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jul 6, 2010·4 cites·11 claims
- 1560US7885137B2Control circuit of flash memory device and method of operating the flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 8, 2011·4 cites·15 claims
- 1657US7558115B2Program method of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jul 7, 2009·3 cites·16 claims
- 1756US7596019B2Non-volatile memory device and method of preventing hot electron program disturb phenomenonHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 29, 2009·2 cites·14 claims
- 1854US7978532B2Erase method of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jul 12, 2011·2 cites·12 claims
- 1953US8004896B2Method of controlling operation of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 23, 2011·2 cites·11 claims
- 2048US9213592B2Semiconductor memory device and method of operating the sameSK HYNIX INC·Filed 2012·Granted Dec 15, 2015·0 cites·21 claims
- 2139US9419654B2Encoding device and method for generating message matrixSK HYNIX INC·Filed 2014·Granted Aug 16, 2016·0 cites·20 claims
- 2239US8792286B2Semiconductor memory device and operating method thereofJOO SEOK JIN·Filed 2011·Granted Jul 29, 2014·0 cites·17 claims
- 2338US2015200686A1Encoding device, decoding device, and operating method thereofSK HYNIX INC·Filed 2014·Application pending·0 cites
- 2437US8854886B2Memory and program method thereofJOO SEOK-JIN·Filed 2012·Granted Oct 7, 2014·0 cites·19 claims
- 2537US6717849B2Flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Apr 6, 2004·1 cites·2 claims
- 2637US2009285020A1Method of programming a multi level cell in a non-volatile memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 2737US2014136925A1Method of operating a data storage deviceSK HYNIX INC·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →