Inventor · disambiguated record
Derek Aqui
Also filed as: AQUI DEREK · AQUI DEREK G · AQUI DEREK GRAHAM
17 granted patents·6 pending applications·168 citations·filing 1993–2025
93Inventor score
Files withHIGH YIELD TECHNOLOGY6DWFRITZ AUTOMATION INC4DWFRITZ AUTOMATION LLC4ZUNIGA STEVEN M4AQUI DEREK2
Top patents by PatentIndex Score
23 records- 0186US8309374B2Advanced platform for processing crystalline silicon solar cellsPORTHOUSE KEITH BRIAN·Filed 2009·Granted Nov 13, 2012·16 cites·25 claims
- 0284US8173473B2Laser system for processing solar wafers in a carrierAQUI DEREK·Filed 2010·Granted May 8, 2012·9 cites·20 claims
- 0377US8151852B2Bonding apparatus and methodZUNIGA STEVEN M·Filed 2009·Granted Apr 10, 2012·5 cites·11 claims
- 0476US10598521B2Metrology systemDWFRITZ AUTOMATION INC·Filed 2019·Granted Mar 24, 2020·1 cites·24 claims
- 0575US2025313425A1Web singulation for feeding electrodes to battery stackerDWFRITZ AUTOMATION LLC·Filed 2025·Application pending·0 cites
- 0673US12146736B2Metrology systemAQUI DEREK·Filed 2022·Granted Nov 19, 2024·0 cites·8 claims
- 0772US5347138AIn situ real time particle monitor for a sputter coater chamberHIGH YIELD TECHNOLOGY·Filed 1993·Granted Sep 13, 1994·35 cites·18 claims
- 0872US2025219123A1System and method for battery stacking and singulating a film materialDW ENERGY LLC·Filed 2024·Application pending·0 cites
- 0968US8360409B2Apparatus and method for simultaneous treatment of multiple workpiecesGTAT CORP·Filed 2009·Granted Jan 29, 2013·3 cites·22 claims
- 1066US11486689B2Metrology systemDWFRITZ AUTOMATION INC·Filed 2020·Granted Nov 1, 2022·0 cites·9 claims
- 1166US5637881AMethod to detect non-spherical particles using orthogonally polarized lightHIGH YIELD TECHNOLOGY·Filed 1995·Granted Jun 10, 1997·32 cites·10 claims
- 1266US5436465AModular particle monitor for vacuum process equipmentHIGH YIELD TECHNOLOGY·Filed 1993·Granted Jul 25, 1995·31 cites·16 claims
- 1363US8334191B2Two-chamber system and method for serial bonding and exfoliation of multiple workpiecesZUNIGA STEVEN M·Filed 2009·Granted Dec 18, 2012·2 cites·22 claims
- 1457US2024234823A9Electrode and separator stacking machines for high-speed battery productionDWFRITZ AUTOMATION LLC·Filed 2023·Application pending·0 cites
- 1554US2024421339A1Z-fold prismatic battery interleave stacker machineDWFRITZ AUTOMATION LLC·Filed 2022·Application pending·0 cites
- 1650US5534706AParticle monitor for throttled pumping systemsHIGH YIELD TECHNOLOGY·Filed 1994·Granted Jul 9, 1996·17 cites·12 claims
- 1748US8545660B1Bonding apparatus and methodZUNIGA STEVEN M·Filed 2012·Granted Oct 1, 2013·0 cites·10 claims
- 1847US8207047B2Apparatus and method for simultaneous treatment of multiple workpiecesZUNIGA STEVEN M·Filed 2009·Granted Jun 26, 2012·0 cites·21 claims
- 1945US12492891B2Non-contact optical measurement devices and exchangeable optical probesDWFRITZ AUTOMATION LLC·Filed 2020·Granted Dec 9, 2025·0 cites·14 claims
- 2044US5606418AQuasi bright field particle sensorHIGH YIELD TECHNOLOGY·Filed 1995·Granted Feb 25, 1997·10 cites·18 claims
- 2144US2019351516A1Micro assembly using micro multi-toolsDWFRITZ AUTOMATION INC·Filed 2019·Application pending·0 cites
- 2241US2014098216A1Simultaneous-view object insertion systems, apparatuses and methodsDWFRITZ AUTOMATION INC·Filed 2013·Application pending·0 cites
- 2338US5773841ASelf aligning vacuum seal assemblyHIGH YIELD TECHNOLOGY·Filed 1995·Granted Jun 30, 1998·7 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →