Inventor · disambiguated record
Toshihiko Yokota
Also filed as: YOKOTA TOSHIHIKO
7 granted patents·1 pending application·20 citations·filing 2005–2008
78Inventor score
Top patents by PatentIndex Score
8 records- 0174US7752513B2Method and circuit for LSSD testingIBM·Filed 2007·Granted Jul 6, 2010·11 cites·10 claims
- 0266US7356797B2Logic transformation and gate placement to avoid routing congestionIBM·Filed 2005·Granted Apr 8, 2008·5 cites·13 claims
- 0352US7793183B2Microcomputer and method of testing the sameIBM·Filed 2006·Granted Sep 7, 2010·2 cites·12 claims
- 0451US7752586B2Design structure of an integration circuit and test method of the integrated circuitIBM·Filed 2007·Granted Jul 6, 2010·2 cites·10 claims
- 0546US8006210B2Logic transformation and gate placement to avoid routing congestionIBM·Filed 2008·Granted Aug 23, 2011·0 cites·9 claims
- 0639US8161445B2Logic transformation and gate placement to avoid routing congestionBHAT CHAITRA M·Filed 2008·Granted Apr 17, 2012·0 cites·6 claims
- 0737US7930608B2Circuit for controlling voltage fluctuation in integrated circuitIBM·Filed 2008·Granted Apr 19, 2011·0 cites·17 claims
- 0834US2007124635A1Integration circuit and test method of the sameIBM·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →