Inventor · disambiguated record
Henning Hartmann
Also filed as: HARTMANN HENNING
2 granted patents·2 pending applications·38 citations·filing 2001–2005
59Inventor score
Files withINFINEON TECHNOLOGIES AG4
Top patents by PatentIndex Score
4 records- 0181US6895538B2Method for testing a device and a test configuration including a device with a test memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 17, 2005·36 cites·12 claims
- 0235US6515514B2Method and circuit configuration for controlling a data driverINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 4, 2003·2 cites·12 claims
- 0332US2005201134A1Memory component with asymmetrical contact rowINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 0432US2006002208A1Housing for a semiconductor device and semiconductor device testing system for testing the contacting for semiconductor devices positioned one above the otherINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →