Inventor · disambiguated record
Dae Gab Gweon
Also filed as: GWEON DAE G · GWEON DAE-GAB
13 granted patents·1 pending application·108 citations·filing 1993–2008
91Inventor score
Files withKOREA ADVANCED INST SCI & TECH4SAMSUNG ELECTRONICS CO LTD3SAM JUNG CO LTD2EUN JIN SOHN PATENT & LAW OFFI1KOREA ADVANCED INST OF TECHNOL1
Top patents by PatentIndex Score
14 records- 0188US7240434B2Stage apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jul 10, 2007·16 cites·36 claims
- 0281US7324273B2Confocal self-interference microscopy from which side lobe has been removedEUN JIN SOHN PATENT & LAW OFFI·Filed 2006·Granted Jan 29, 2008·16 cites·10 claims
- 0373US7024925B23-axis straight-line motion stage and sample test device using the sameKOREA ADVANCED INST SCI & TECH·Filed 2003·Granted Apr 11, 2006·14 cites·20 claims
- 0472US7508098B2Transfer apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 24, 2009·4 cites·20 claims
- 0571US6493156B1High resolution lensLG ELECTRONICS INC·Filed 2000·Granted Dec 10, 2002·16 cites·12 claims
- 0667US7388712B2Confocal scanning microscope using two Nipkow disksSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 17, 2008·4 cites·19 claims
- 0763US7439483B2Real-time confocal microscope using the dispersion opticsKOREA ADVANCED INST SCI & TECH·Filed 2006·Granted Oct 21, 2008·3 cites·7 claims
- 0854US6836033B2Apparatus for precisely driving X-Y stages using VCMKOREA ADVANCED INST SCI & TECH·Filed 2003·Granted Dec 28, 2004·7 cites·28 claims
- 0954US6744510B2Ellipsometer and precision auto-alignment method for incident angle of the ellipsometer without auxiliary equipmentKOREA ADVANCED INST SCI & TECH·Filed 2002·Granted Jun 1, 2004·5 cites·4 claims
- 1051US6563098B2High-precision displacement measurement device and method using unit displacement sensor based on confocal theoryKOREA ADVANCED INST OF TECHNOL·Filed 2001·Granted May 13, 2003·5 cites·6 claims
- 1147US5483391AMethod of and apparatus for adjusting deck mechanism of video cassette recorderSAM JUNG CO LTD·Filed 1993·Granted Jan 9, 1996·9 cites·17 claims
- 1241US7821632B2Sample traveling stage with flexure mechanism module to absorb the deformation of the slideSOONHAN ENG CORP·Filed 2008·Granted Oct 26, 2010·0 cites·9 claims
- 1335US5774210APerpendicularity measuring method and an apparatus thereofSAM JUNG CO LTD·Filed 1996·Granted Jun 30, 1998·9 cites·12 claims
- 1433US2006084876A1Method for reducing auto-fluorescence signals in confocal Raman microscopyOH CHIL H·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →