Inventor · disambiguated record
Uwe Luecken
Also filed as: LUECKEN UWE
12 granted patents·1 pending application·116 citations·filing 2008–2014
91Inventor score
Files withFEI CO6LUECKEN UWE3BISCHOFF MAARTEN1TIEMEIJER PETER CHRISTIAAN1VAN DEN BOOM STEPHANUS HUBERTUS LEONARDUS1
Top patents by PatentIndex Score
13 records- 0194US8334512B2Detector system for use with transmission electron microscope spectroscopyLUECKEN UWE·Filed 2011·Granted Dec 18, 2012·26 cites·16 claims
- 0291US8338782B2Detector system for transmission electron microscopeLUECKEN UWE·Filed 2011·Granted Dec 25, 2012·17 cites·14 claims
- 0390US7845245B2Method for attaching a sample to a manipulator by melting and then freezing part of said sampleFEI CO·Filed 2008·Granted Dec 7, 2010·20 cites·20 claims
- 0488US9147551B2Method for electron tomographyFEI CO·Filed 2014·Granted Sep 29, 2015·10 cites·20 claims
- 0585US8912491B2Method of performing tomographic imaging of a sample in a charged-particle microscopeFEI CO·Filed 2013·Granted Dec 16, 2014·7 cites·18 claims
- 0684US7825378B2Method for obtaining a scanning transmission image of a sample in a particle-optical apparatusFEI CO·Filed 2008·Granted Nov 2, 2010·15 cites·18 claims
- 0779US8592762B2Method of using a direct electron detector for a TEMLUECKEN UWE·Filed 2011·Granted Nov 26, 2013·5 cites·13 claims
- 0876US8817148B2Method for acquiring data with an image sensorFEI CO·Filed 2012·Granted Aug 26, 2014·3 cites·20 claims
- 0974US8692196B2Method of use for a multipole detector for a transmission electron microscopeTIEMEIJER PETER CHRISTIAAN·Filed 2009·Granted Apr 8, 2014·4 cites·11 claims
- 1073US8569693B2Distortion free stigmation of a TEMBISCHOFF MAARTEN·Filed 2012·Granted Oct 29, 2013·4 cites·14 claims
- 1171US9202670B2Method of investigating the wavefront of a charged-particle beamFEI CO·Filed 2014·Granted Dec 1, 2015·3 cites·19 claims
- 1260US8757873B2Method of measuring the temperature of a sample carrier in a charged particle-optical apparatusVAN DEN BOOM STEPHANUS HUBERTUS LEONARDUS·Filed 2011·Granted Jun 24, 2014·2 cites·17 claims
- 1333US2013316365A1Method of Preparing a Biological Sample for Inspection with Electron Microscopy and Fluorescent Light MicroscopyVAN DONSELAAR ELLY·Filed 2011·Application pending·0 cites
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