Inventor · disambiguated record
Michael Frederick Hayles
Also filed as: HAYLES MICHAEL F · HAYLES MICHAEL FREDERICK
5 granted patents·101 citations·filing 1999–2014
81Inventor score
Top patents by PatentIndex Score
5 records- 0190US8754384B1Sample preparation stageFEI CORP·Filed 2014·Granted Jun 17, 2014·45 cites·18 claims
- 0290US7845245B2Method for attaching a sample to a manipulator by melting and then freezing part of said sampleFEI CO·Filed 2008·Granted Dec 7, 2010·20 cites·20 claims
- 0379US6888136B2Method of obtaining a particle-optical image of a sample in a particle-optical deviceFEI CO·Filed 2003·Granted May 3, 2005·19 cites·7 claims
- 0460US8674323B2Forming an electron microscope sample from high-pressure frozen materialFEI CO·Filed 2013·Granted Mar 18, 2014·1 cites·17 claims
- 0557US6376839B1SEM for transmission operation with a location-sensitive detectorPHILIPS ELECTRON OPTICS·Filed 1999·Granted Apr 23, 2002·16 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →