Inventor · disambiguated record
Atsuko Katayama
Also filed as: KATAYAMA ATSUKO
10 granted patents·502 citations·filing 1997–2004
92Inventor score
Top patents by PatentIndex Score
10 records- 0197US7189576B2Method for measuring substance and testing pieceARKRAY INC·Filed 2003·Granted Mar 13, 2007·123 cites·16 claims
- 0296US7153696B2Method for measuring substance and testing pieceARKRAY INC·Filed 2003·Granted Dec 26, 2006·116 cites·5 claims
- 0396US7098038B2Method for measuring substance and testing pieceARKRAY INC·Filed 2003·Granted Aug 29, 2006·116 cites·14 claims
- 0482US6489649B2Semiconductor device having nonvolatile memory and method of manufacturing thereofHITACHI LTD·Filed 1997·Granted Dec 3, 2002·54 cites·21 claims
- 0577US6777243B2Method for measuring substance and testing pieceARKRAY INC·Filed 2003·Granted Aug 17, 2004·20 cites·14 claims
- 0674US6596585B2Method of manufacturing semiconductor deviceHITACHI LTD·Filed 2001·Granted Jul 22, 2003·23 cites·8 claims
- 0773US6764902B2Method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Jul 20, 2004·21 cites·11 claims
- 0859US7393502B2Test device for analysis of a liquid sampleKYOTO DAIICHI KAGAKU KK·Filed 2002·Granted Jul 1, 2008·3 cites·9 claims
- 0957US7075139B2Method of manufacturing semiconductor deviceHITACHI LTD·Filed 2004·Granted Jul 11, 2006·9 cites·6 claims
- 1043US6540962B1Testing instrument for analyzing liquid sampleKYOTO DAIICHI KAGAKU KK·Filed 1998·Granted Apr 1, 2003·17 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →