Inventor · disambiguated record
Jonathan B. Buckheit
Also filed as: BUCKHEIT JONATHAN B
7 granted patents·1 pending application·55 citations·filing 1999–2010
82Inventor score
Top patents by PatentIndex Score
8 records- 0177US8380472B2Semiconductor yield management system and methodRUDOLPH TECHNOLOGIES INC·Filed 2008·Granted Feb 19, 2013·5 cites·20 claims
- 0269US6470229B1Semiconductor yield management system and methodYIELD DYNAMICS INC·Filed 1999·Granted Oct 22, 2002·37 cites·22 claims
- 0360US8190952B2Bitmap cluster analysis of defects in integrated circuitsHO TOM T·Filed 2010·Granted May 29, 2012·3 cites·20 claims
- 0458US7954018B2Analysis techniques for multi-level memoryRUDOLPH TECHNOLOGIES INC·Filed 2007·Granted May 31, 2011·4 cites·29 claims
- 0548US6768961B2System and method for analyzing error information from a semiconductor fabrication processYIELD DYAMICS INC·Filed 2001·Granted Jul 27, 2004·4 cites·20 claims
- 0647USRE42481ESemiconductor yield management system and methodRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Jun 21, 2011·2 cites·34 claims
- 0741US2006095237A1Semiconductor yield management system and methodWANG WEIDONG·Filed 2004·Application pending·0 cites
- 0838US7685481B2Bitmap cluster analysis of defects in integrated circuitsMKS INSTR INC·Filed 2005·Granted Mar 23, 2010·0 cites·31 claims
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