Inventor · disambiguated record
Masayuki Motohama
Also filed as: MOTOHAMA MASAYUKI
3 granted patents·1 pending application·26 citations·filing 1997–2007
68Inventor score
Technology areasG01R
Files withKODERA KEISUKE1MATASUSHITA ELECTRIC IND CO LT1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1PANASONIC CORP1
Top patents by PatentIndex Score
4 records- 0161US7565582B2Circuit for testing the AC timing of an external input/output terminal of a semiconductor integrated circuitPANASONIC CORP·Filed 2007·Granted Jul 21, 2009·5 cites·6 claims
- 0244US5901154AMethod for producing test program for semiconductor deviceMATASUSHITA ELECTRIC IND CO LT·Filed 1997·Granted May 4, 1999·16 cites·18 claims
- 0328US5894424ASemiconductor testing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Apr 13, 1999·5 cites·12 claims
- 0427US2009105970A1Semiconductor testerKODERA KEISUKE·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →