Inventor · disambiguated record
Lieven De Jonge
Also filed as: DE JONGE LIEVEN
5 granted patents·96 citations·filing 2003–2006
81Inventor score
Top patents by PatentIndex Score
5 records- 0182US7299145B2Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probeMETRIS N V·Filed 2006·Granted Nov 20, 2007·16 cites·26 claims
- 0281US7428061B2Optical probe for scanning the features of an object and methods thereofMETRIS IPR N V·Filed 2006·Granted Sep 23, 2008·25 cites·26 claims
- 0381US7009717B2Optical probe for scanning the features of an object and methods thereforMETRIS N V·Filed 2003·Granted Mar 7, 2006·34 cites·42 claims
- 0473US6944564B2Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probeMETRIS N V·Filed 2003·Granted Sep 13, 2005·21 cites·46 claims
- 0540US7672810B2Method, device and computer program for evaluating an object using a virtual representation of said object3D SCANNERS LTD·Filed 2004·Granted Mar 2, 2010·0 cites·41 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →