Inventor · disambiguated record
Jiro Hashizume
Also filed as: HASHIZUME JIRO
10 granted patents·3 pending applications·546 citations·filing 1990–2022
89Inventor score
Files withHITACHI LTD4HASHIZUME JIRO3MATSUSHITA ELECTRIC WORKS LTD3HITACHI AUTOMOTIVE SYSTEMS LTD1HITACHI HIGH TECH CORP1
Top patents by PatentIndex Score
13 records- 0197US6874910B2Light source device using LED, and method of producing sameMATSUSHITA ELECTRIC WORKS LTD·Filed 2001·Granted Apr 5, 2005·278 cites·22 claims
- 0295US6331063B1LED luminaire with light control meansMATSUSHITA ELECTRIC WORKS LTD·Filed 1998·Granted Dec 18, 2001·218 cites·13 claims
- 0384US8023390B2Optical head and optical disk deviceHITACHI LTD·Filed 2008·Granted Sep 20, 2011·6 cites·20 claims
- 0479US8562150B2Optical axis adjustment device, method for adjusting optical axis and projection-type display apparatusHASHIZUME JIRO·Filed 2010·Granted Oct 22, 2013·5 cites·13 claims
- 0571US10082456B2Photothermal conversion spectroscopic analyzerHITACHI LTD·Filed 2015·Granted Sep 25, 2018·1 cites·1 claims
- 0671US9835508B2Pressure sensor having strain gauges disposed on a diaphragmHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2013·Granted Dec 5, 2017·4 cites·9 claims
- 0762US8139933B2Imaging deviceHASHIZUME JIRO·Filed 2010·Granted Mar 20, 2012·1 cites·20 claims
- 0855US11210770B2AI-based inspection in transportationHITACHI LTD·Filed 2019·Granted Dec 28, 2021·0 cites·17 claims
- 0955US5126818ASemiconductor deviceMATSUSHITA ELECTRIC WORKS LTD·Filed 1990·Granted Jun 30, 1992·33 cites·4 claims
- 1045US2025148239A1Test Sample Reading Device and Test Sample Reading MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1144US2016086628A1Optical Component Positioning Device and Optical Recording Device Using SameHITACHI LTD·Filed 2013·Application pending·0 cites
- 1243US8320229B2Variable mirror actuator and optical disc driveHASHIZUME JIRO·Filed 2010·Granted Nov 27, 2012·0 cites·20 claims
- 1336US2002006040A1Led luminaire with light control meansFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →