Inventor · disambiguated record
Kurt Taylor
Also filed as: TAYLOR KURT · TAYLOR KURT O · TAYLOR KURT OWEN
9 granted patents·169 citations·filing 2000–2006
89Inventor score
Files withADVANCED MICRO DEVICES INC9
Top patents by PatentIndex Score
9 records- 0188US6362524B1Edge seal ring for copper damascene process and method for fabrication thereofADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 26, 2002·53 cites·15 claims
- 0286US6798230B1Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 28, 2004·50 cites·21 claims
- 0377US7155359B1Determination of device failure characteristicADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 26, 2006·20 cites·13 claims
- 0471US6516450B1Variable design rule toolADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 4, 2003·21 cites·21 claims
- 0569US7340360B1Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thicknessADVANCED MICRO DEVICES INC·Filed 2006·Granted Mar 4, 2008·7 cites·16 claims
- 0661US7205165B1Method for determining the reliability of dielectric layersADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 17, 2007·9 cites·26 claims
- 0760US6355511B1Method of providing a frontside contact to substrate of SOI deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 12, 2002·6 cites·14 claims
- 0842US6762613B1Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric materialADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 13, 2004·3 cites·10 claims
- 0941US6514802B2Method of providing a frontside contact to a substrate of SOI deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 4, 2003·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →