Inventor · disambiguated record
Toyoharu Okumoto
Also filed as: OKUMOTO TOYOHARU
15 granted patents·3 pending applications·263 citations·filing 1988–2008
94Inventor score
Top patents by PatentIndex Score
18 records- 0192US7161141B2Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate massHITACHI HIGH TECH CORP·Filed 2005·Granted Jan 9, 2007·15 cites·7 claims
- 0289US5308977APlasma mass spectrometerHITACHI LTD·Filed 1993·Granted May 3, 1994·61 cites·10 claims
- 0387US7186973B2Ion trap/time-of-flight mass analyzing apparatus and mass analyzing methodHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 6, 2007·11 cites·10 claims
- 0481US6248998B1Plasma ion source mass spectrometerHITACHI LTD·Filed 1998·Granted Jun 19, 2001·39 cites·2 claims
- 0577US6914239B2System for analyzing mass spectrometric dataHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 5, 2005·13 cites·19 claims
- 0677US5793039AMass spectrometer, skimmer cone assembly, skimmer cone and its manufacturing methodHITACHI LTD·Filed 1996·Granted Aug 11, 1998·31 cites·12 claims
- 0768US5252827AMethod and apparatus for analysis of gases using plasmaHITACHI LTD·Filed 1991·Granted Oct 12, 1993·21 cites·27 claims
- 0863US5202562AHigh sensitive element analyzing method and apparatus of the sameHITACHI LTD·Filed 1991·Granted Apr 13, 1993·16 cites·15 claims
- 0960US5616918APlasma ion mass spectrometer and plasma mass spectrometry using the sameHITACHI LTD·Filed 1995·Granted Apr 1, 1997·14 cites·16 claims
- 1056US2007069121A1Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate massHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 1147US2009001052A1Plasma processing apparatus and plasma processing methodMAKINO AKITAKA·Filed 2008·Application pending·0 cites
- 1244US4867562AAtomic absorption spectrophotometerHITACHI LTD·Filed 1988·Granted Sep 19, 1989·10 cites·6 claims
- 1342US5104220AAtomic absorption spectrophotometer and analyzing methodHITACHI LTD·Filed 1989·Granted Apr 14, 1992·9 cites·5 claims
- 1440US5763877AAnalyzer using plasma and analysis method using plasma, interface used for the same and sample introducing component used for the sameHITACHI LTD·Filed 1996·Granted Jun 9, 1998·7 cites·12 claims
- 1540US2006027324A1Plasma processing apparatus and plasma processing methodMAKINO AKITAKA·Filed 2005·Application pending·0 cites
- 1637US5108178AAtomic absorption spectrophotometer and electromagnetic shut-off valve for use thereinHITACHI LTD·Filed 1990·Granted Apr 28, 1992·6 cites·21 claims
- 1737US4840484AAtomic absorption spectrophotometer with furnace at pressure equal or near light source pressureHITACHI LTD·Filed 1988·Granted Jun 20, 1989·6 cites·7 claims
- 1833US4890919AAtomic absorption spectrophotometerHITACHI LTD·Filed 1988·Granted Jan 2, 1990·4 cites·8 claims
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