Inventor · disambiguated record
Dermot Cantwell
Also filed as: CANTWELL DERMOT · CANTWELL DERMOT P · CANTWELL DERMOT PATRICK
30 granted patents·11 pending applications·708 citations·filing 2005–2025
96Inventor score
Top patents by PatentIndex Score
41 records- 0198US8496756B2Methods for processing substrates in process systems having shared resourcesCRUSE JAMES P·Filed 2010·Granted Jul 30, 2013·518 cites·20 claims
- 0296US10929586B2Predictive spatial digital design of experiment for advanced semiconductor process optimization and controlAPPLIED MATERIALS INC·Filed 2020·Granted Feb 23, 2021·6 cites·20 claims
- 0395US7424431B2System, method and computer program product for adding voice activation and voice control to a media playerSTRAGENT LLC·Filed 2005·Granted Sep 9, 2008·99 cites·63 claims
- 0492US10565513B2Time-series fault detection, fault classification, and transition analysis using a K-nearest-neighbor and logistic regression approachAPPLIED MATERIALS INC·Filed 2016·Granted Feb 18, 2020·11 cites·17 claims
- 0591US9200950B2Pulsed plasma monitoring using optical sensor and a signal analyzer forming a mean waveformLIAN LEI·Filed 2014·Granted Dec 1, 2015·19 cites·20 claims
- 0687US11586794B2Semiconductor processing tools with improved performance by use of hybrid learning modelsAPPLIED MATERIALS INC·Filed 2020·Granted Feb 21, 2023·2 cites·17 claims
- 0785US7567907B2System, method and computer program product for adding voice activation and voice control to a media playerSTRAGENT LLC·Filed 2008·Granted Jul 28, 2009·15 cites·71 claims
- 0884US12158735B2Process recipe creation and matching using feature modelsAPPLIED MATERIALS INC·Filed 2023·Granted Dec 3, 2024·0 cites·20 claims
- 0984US10930531B2Adaptive control of wafer-to-wafer variability in device performance in advanced semiconductor processesAPPLIED MATERIALS INC·Filed 2018·Granted Feb 23, 2021·3 cites·20 claims
- 1083US12253476B2Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2024·Granted Mar 18, 2025·0 cites·20 claims
- 1183US11328964B2Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2019·Granted May 10, 2022·2 cites·20 claims
- 1283US2024310826A1Comprehensive analysis module for determining processing equipment performanceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1383US2024310825A1Comprehensive analysis module for determining processing equipment performanceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1481US9934351B2Wafer point by point analysis and data presentationAPPLIED MATERIALS INC·Filed 2015·Granted Apr 3, 2018·4 cites·20 claims
- 1580US10657214B2Predictive spatial digital design of experiment for advanced semiconductor process optimization and controlAPPLIED MATERIALS INC·Filed 2018·Granted May 19, 2020·3 cites·20 claims
- 1680US8473247B2Methods for monitoring processing equipmentCRUSE JAMES P·Filed 2010·Granted Jun 25, 2013·5 cites·20 claims
- 1780US7953599B2System, method and computer program product for adding voice activation and voice control to a media playerSTRAGENT LLC·Filed 2008·Granted May 31, 2011·10 cites·144 claims
- 1880US2023280736A1Comprehensive analysis module for determining processing equipment performanceAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1979US11874234B2Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2023·Granted Jan 16, 2024·0 cites·20 claims
- 2079US2025293062A1Adaptive control of variability in device performance in advanced semiconductor processesAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 2178US12131269B2Time-series fault detection, fault classification, and transition analysis using a k-nearest-neighbor and logistic regression approachAPPLIED MATERIALS INC·Filed 2020·Granted Oct 29, 2024·1 cites·20 claims
- 2278US2024355687A1Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 2375US12074073B2Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2022·Granted Aug 27, 2024·0 cites·17 claims
- 2475US11860591B2Process recipe creation and matching using feature modelsAPPLIED MATERIALS INC·Filed 2021·Granted Jan 2, 2024·0 cites·14 claims
- 2574US11585764B1Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing systemAPPLIED MATERIALS INC·Filed 2021·Granted Feb 21, 2023·0 cites·20 claims
- 2672US9910430B2K-nearest neighbor-based method and system to provide multi-variate analysis on tool process dataAPPLIED MATERIALS INC·Filed 2013·Granted Mar 6, 2018·3 cites·20 claims
- 2772US2024046096A1Predictive modeling of a manufacturing process using a set of trained inverted modelsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2871US8721798B2Methods for processing substrates in process systems having shared resourcesCRUSE JAMES P·Filed 2010·Granted May 13, 2014·2 cites·16 claims
- 2970US11275975B2Fault detection classificationAPPLIED MATERIALS INC·Filed 2017·Granted Mar 15, 2022·1 cites·20 claims
- 3068US11947888B2Semiconductor processing tools with improved performance by use of hybrid learning modelsAPPLIED MATERIALS INC·Filed 2023·Granted Apr 2, 2024·0 cites·15 claims
- 3167US9262726B2Using radial basis function networks and hyper-cubes for excursion classification in semi-conductor processing equipmentAPPLIED MATERIALS INC·Filed 2014·Granted Feb 16, 2016·3 cites·20 claims
- 3266US12322618B2Adaptive control of variability in device performance in advanced semiconductor processesAPPLIED MATERIALS INC·Filed 2021·Granted Jun 3, 2025·0 cites·20 claims
- 3363US9852371B2Using radial basis function networks and hyper-cubes for excursion classification in semi-conductor processing equipmentAPPLIED MATERIALS INC·Filed 2016·Granted Dec 26, 2017·1 cites·17 claims
- 3462US2025208597A1Endpoint detection by generating synthetic sensor dataAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 3560US11829873B2Predictive modeling of a manufacturing process using a set of trained inverted modelsAPPLIED MATERIALS INC·Filed 2020·Granted Nov 28, 2023·0 cites·18 claims
- 3655US2024037442A1Generating indications of learning of models for semiconductor processingAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 3752US2023051330A1Using defect models to estimate defect risk and optimize process recipesAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 3852US2011196683A1System, Method And Computer Program Product For Adding Voice Activation And Voice Control To A Media PlayerSTRAGENT LLC·Filed 2011·Application pending·0 cites
- 3949US2022284342A1Systems and methods for process chamber health monitoring and diagnostics using virtual modelAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 4048US10242472B2Trend dynamic sensor imaging using contour maps to visualize multiple trend data sets in a single viewAPPLIED MATERIALS INC·Filed 2018·Granted Mar 26, 2019·0 cites·20 claims
- 4145US9881398B2Trend dynamic sensor imaging using contour maps to visualize multiple trend data sets in a single viewAPPLIED MATERIALS INC·Filed 2013·Granted Jan 30, 2018·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →