Inventor · disambiguated record
John Michael Carulli, Jr.
Also filed as: CARULLI JOHN M · CARULLI JOHN MICHAEL · CARULLI JR JOHN M · CARULLI JR JOHN MICHAEL
9 granted patents·87 citations·filing 2004–2014
87Inventor score
Top patents by PatentIndex Score
9 records- 0195US9714966B2Circuit aging sensorTEXAS INSTRUMENTS INC·Filed 2013·Granted Jul 25, 2017·31 cites·20 claims
- 0281US8689168B1Reliability determination taking into account effect of component failures on circuit operationTEXAS INSTRUMENTS INC·Filed 2012·Granted Apr 1, 2014·6 cites·11 claims
- 0377US9275747B2Integrated circuit with automatic total ionizing dose (TID) exposure deactivationBAUMANN ROBERT CHRISTOPHER·Filed 2012·Granted Mar 1, 2016·7 cites·26 claims
- 0477US7494829B2Identification of outlier semiconductor devices using data-driven statistical characterizationTEXAS INSTRUMENTS INC·Filed 2007·Granted Feb 24, 2009·10 cites·8 claims
- 0569US7292058B2Method for estimating the early failure rate of semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 6, 2007·15 cites·20 claims
- 0665US7129735B2Method for test data-driven statistical detection of outlier semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 31, 2006·12 cites·9 claims
- 0758US8126681B2Semiconductor outlier identification using serially-combined data transform processing methodologiesNAHAR AMIT V·Filed 2009·Granted Feb 28, 2012·4 cites·19 claims
- 0850US7865849B2System and method for estimating test escapes in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jan 4, 2011·2 cites·18 claims
- 0947US10101386B2Real time semiconductor process excursion monitorTEXAS INSTRUMENTS INC·Filed 2014·Granted Oct 16, 2018·0 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →