Inventor · disambiguated record
Werner Heinrich
Also filed as: HEINRICH WERNER
9 granted patents·2 pending applications·99 citations·filing 1996–2015
85Inventor score
Top patents by PatentIndex Score
11 records- 0176US10168301B2Method and device for defect-size evaluationSIEMENS AG·Filed 2014·Granted Jan 1, 2019·4 cites·20 claims
- 0273US9829468B2Method and device for detecting defects within a test objectSIEMENS AG·Filed 2012·Granted Nov 28, 2017·2 cites·16 claims
- 0372US8656782B2Method and device for non-destructive material testing of a test object using ultrasonic wavesBOEHM RAINER·Filed 2008·Granted Feb 25, 2014·7 cites·19 claims
- 0470US8197129B2Method and apparatus for determining component parameters by means of thermographyGOLDAMMER MATTHIAS·Filed 2007·Granted Jun 12, 2012·7 cites·16 claims
- 0569US6085203AMethod for converting data formats which differ from one anotherSIEMENS AG·Filed 1996·Granted Jul 4, 2000·74 cites·14 claims
- 0655US7463039B2Probe for electrical measurement methods, especially eddy current measurementsSIEMENS AG·Filed 2004·Granted Dec 9, 2008·2 cites·11 claims
- 0754US9329155B2Method and device for determining an orientation of a defect present within a mechanical componentSIEMENS AG·Filed 2015·Granted May 3, 2016·0 cites·22 claims
- 0850US2013167645A1Method and device for determining an orientation of a defect present within a mechanical componentGOLDAMMER MATTHIAS·Filed 2011·Application pending·0 cites
- 0943US7194648B2Process for time synchronization of at least two clocks in a microprocessor systemEADS DEUTSCHLAND GMBH·Filed 2004·Granted Mar 20, 2007·3 cites·12 claims
- 1043US2016069843A1Sample Disk For Ultrasonic Disk Testing InstallationsSIEMENS AG·Filed 2014·Application pending·0 cites
- 1132US7688067B2Probe for electrical measurement methods and use of a flexible probe for production of a rigid probeSIEMENS AG·Filed 2002·Granted Mar 30, 2010·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →