Inventor · disambiguated record
Mitsuhiro Sekizawa
Also filed as: SEKIZAWA MITSUHIRO
11 granted patents·4 pending applications·8 citations·filing 2009–2018
80Inventor score
Top patents by PatentIndex Score
15 records- 0180US8975567B2Coordinate detectorFUJITSU COMPONENT LTD·Filed 2013·Granted Mar 10, 2015·6 cites·10 claims
- 0269US9459720B2Touch panelFUJITSU COMPONENT LTD·Filed 2013·Granted Oct 4, 2016·2 cites·13 claims
- 0351US9753600B2Touch panelFUJITSU COMPONENT LTD·Filed 2016·Granted Sep 5, 2017·0 cites·6 claims
- 0451US9590623B2Touch panel and method of detecting positionFUJITSU COMPONENT LTD·Filed 2014·Granted Mar 7, 2017·0 cites·11 claims
- 0551US9256337B2Coordinate detection apparatusKONDOH KOICHI·Filed 2009·Granted Feb 9, 2016·0 cites·8 claims
- 0650US9778809B2Coordinate detection apparatusFUJITSU COMPONENT LTD·Filed 2015·Granted Oct 3, 2017·0 cites·5 claims
- 0749US10007373B2Operation panel whose thickness is adjustable with screw operably inserted into hole formed in clip that clips multiple boards and load sensor sandwiched therebetweenFUJITSU COMPONENT LTD·Filed 2014·Granted Jun 26, 2018·0 cites·9 claims
- 0844US9569021B2Touch panel and method of manufacturing the sameFUJITSU COMPONENT LTD·Filed 2013·Granted Feb 14, 2017·0 cites·10 claims
- 0944US2013312804A1Touch panelFUJITSU COMPONENT LTD·Filed 2013·Application pending·0 cites
- 1042US9395861B2Touch panelMATSUDA GENICHI·Filed 2012·Granted Jul 19, 2016·0 cites·5 claims
- 1137US2012255848A1Touch panelSEKIZAWA MITSUHIRO·Filed 2012·Application pending·0 cites
- 1236US2013277186A1Touch panelFUJITSU COMPONENT LTD·Filed 2013·Application pending·0 cites
- 1335US9612701B2Touch panelSEKIZAWA MITSUHIRO·Filed 2011·Granted Apr 4, 2017·0 cites·2 claims
- 1434US9195359B2Providing resistance portions along touch panel electrodes, for adjusting electric potential distributionSEKIZAWA MITSUHIRO·Filed 2012·Granted Nov 24, 2015·0 cites·9 claims
- 1531US2019128723A1Measuring device and measuring systemISHIDA HIROTOSHI·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →