Inventor · disambiguated record
Valentin Rosskopf
Also filed as: ROSSKOPF VALENTIN
12 granted patents·2 pending applications·140 citations·filing 2001–2006
89Inventor score
Top patents by PatentIndex Score
14 records- 0193US6930324B2Device architecture and process for improved vertical memory arraysINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 16, 2005·99 cites·19 claims
- 0273US7372072B2Semiconductor wafer with test structureINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·8 cites·20 claims
- 0359US6853000B2Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 8, 2005·7 cites·9 claims
- 0458US6838724B2Transistor array and semiconductor memory configuration fabricated with the transistor arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 4, 2005·9 cites·12 claims
- 0557US6529031B2Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 4, 2003·7 cites·7 claims
- 0656US7205567B2Semiconductor product having a semiconductor substrate and a test structure and methodINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 17, 2007·1 cites·24 claims
- 0748US6897077B2Test structure for determining a short circuit between trench capacitors in a memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 24, 2005·2 cites·3 claims
- 0847US6856562B2Test structure for measuring a junction resistance in a DRAM memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
- 0946US6484307B2Method for fabricating and checking structures of electronic circuits in a semiconductor substrateINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 19, 2002·3 cites·9 claims
- 1040US6656647B2Method for examining structures on a waferINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 2, 2003·1 cites·12 claims
- 1137US6878965B2Test structure for determining a region of a deep trench outdiffusion in a memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Apr 12, 2005·0 cites·4 claims
- 1232US2006157702A1Kerf with improved fill routineINFINEON TECHNOLOGIES AG·Filed 2006·Application pending·0 cites
- 1331US6930325B2Test structure for improved vertical memory arraysINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 16, 2005·0 cites·20 claims
- 1430US2006138411A1Semiconductor wafer with a test structure, and methodLACHENMANN SUSANNE·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →