Inventor · disambiguated record
Florian Schamberger
Also filed as: SCHAMBERGER FLORIAN
34 granted patents·6 pending applications·321 citations·filing 1999–2007
97Inventor score
Files withINFINEON TECHNOLOGIES AG24SIEMENS AG8QIMONDA AG2INFINEON TECHNOLOGIES1SCHAMBERGER FLORIAN1
Top patents by PatentIndex Score
40 records- 0190US6728902B2Integrated circuit having a self-test device for carrying out a self-test of the integrated circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 27, 2004·68 cites·3 claims
- 0284US6717200B1Vertical field effect transistor with internal annular gate and method of productionSIEMENS AG·Filed 1999·Granted Apr 6, 2004·75 cites·6 claims
- 0374US6418069B2Method of repairing defective memory cells of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jul 9, 2002·21 cites·5 claims
- 0466US7222271B2Method for repairing hardware faults in memory chipsINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 22, 2007·14 cites·15 claims
- 0563US6535046B2Integrated semiconductor circuit with an increased operating voltageINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 18, 2003·9 cites·2 claims
- 0662US6415406B1Integrated circuit having a self-test device and method for producing the integrated circuitSIEMENS AG·Filed 1999·Granted Jul 2, 2002·22 cites·9 claims
- 0759US6868028B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 15, 2005·10 cites·9 claims
- 0856US7181643B2Method for comparing the address of a memory access with an already known address of a faulty memory cellINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 20, 2007·9 cites·2 claims
- 0956US6178124B1Integrated memory having a self-repair functionSIEMENS AG·Filed 1999·Granted Jan 23, 2001·16 cites·6 claims
- 1054US7054180B2Method and circuit for adjusting a resistance in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 30, 2006·6 cites·24 claims
- 1153US7427202B2Means of mounting for electronic components, arrangement and procedureINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 23, 2008·4 cites·60 claims
- 1253US6441677B1Integrated semiconductor circuit with an increased operating voltageINFINEON TECHNOLOGIES AG·Filed 2000·Granted Aug 27, 2002·5 cites·4 claims
- 1350US7047454B2Integrated circuit having a data processing unit and a buffer memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 16, 2006·6 cites·16 claims
- 1450US6800817B2Semiconductor component for connection to a test systemINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 5, 2004·6 cites·9 claims
- 1548US6715118B2Configuration for generating signal impulses of defined lengths in a module with a bist-functionINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 30, 2004·4 cites·4 claims
- 1644US6366518B1Circuit configuration for programming an electrically programmable elementINFINEON TECHNOLOGIES AG·Filed 2000·Granted Apr 2, 2002·4 cites·4 claims
- 1743US6807123B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 19, 2004·3 cites·12 claims
- 1842US6288939B1Circuit configuration for monitoring states of a memory deviceINFINEON TECHNOLOGIES·Filed 2000·Granted Sep 11, 2001·3 cites·5 claims
- 1942US2002149979A1Method for identifying an integrated circuit and integrated circuitFiled 2002·Application pending·0 cites
- 2041US6675322B1Integrated circuit having a self-test deviceSIEMENS AG·Filed 1999·Granted Jan 6, 2004·9 cites·6 claims
- 2139US7296198B2Method for testing semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 13, 2007·2 cites·22 claims
- 2239US6768695B2Circuit configuration for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 27, 2004·2 cites·11 claims
- 2338US6919234B2Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 19, 2005·0 cites·23 claims
- 2438US6449206B2Semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 10, 2002·2 cites·15 claims
- 2537US6229206B1Bonding pad test configurationSIEMENS AG·Filed 1999·Granted May 8, 2001·6 cites·3 claims
- 2637US2005023637A1Method for producing an antifuse structure and antifuseFiled 2003·Application pending·0 cites
- 2737US2008155313A1Semiconductor memory device and methodQIMONDA AG·Filed 2007·Application pending·0 cites
- 2836US6788129B2Integrated circuit having a programmable element and method of operating the circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·0 cites·6 claims
- 2936US6717437B2Semiconductor moduleINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 6, 2004·2 cites·6 claims
- 3036US6557130B1Configuration and method for storing the test results obtained by a BIST circuitSIEMENS AG·Filed 1999·Granted Apr 29, 2003·6 cites·4 claims
- 3136US6313656B1Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making pointSIEMENS AG·Filed 1999·Granted Nov 6, 2001·6 cites·8 claims
- 3236US6292414B1Method for repairing defective memory cells of an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2000·Granted Sep 18, 2001·1 cites·13 claims
- 3334US7808272B2Integrated circuitQIMONDA AG·Filed 2005·Granted Oct 5, 2010·0 cites·13 claims
- 3434US6804166B2Method and apparatus for operating a semiconductor memory at double data transfer rateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 12, 2004·0 cites·3 claims
- 3533US6856186B2Circuit configuration for level boosting, in particular for driving a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 15, 2005·0 cites·9 claims
- 3633US2008062738A1Storage element and method for operating a storage elementSCHAMBERGER FLORIAN·Filed 2006·Application pending·0 cites
- 3732US6344757B1Circuit configuration for programming an electrically programmable elementINFINEON TECHNOLOGIES AG·Filed 2000·Granted Feb 5, 2002·0 cites·8 claims
- 3831US2002170023A1Method and apparatus for supplying current to a semiconductor memory chipFiled 2002·Application pending·0 cites
- 3931US2002136061A1Method and memory system for writing in dataFiled 2002·Application pending·0 cites
- 4030US6320368B1Method for determining the drive capability of a driver circuit of an integrated circuitSIEMENS AG·Filed 1999·Granted Nov 20, 2001·0 cites·5 claims
Join the waitlist — get patent alerts
Get an alert when Florian Schamberger files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →