Inventor · disambiguated record
Toshihiro Ishizuka
Also filed as: ISHIZUKA TOSHIHIRO
10 granted patents·4 pending applications·152 citations·filing 1986–2015
90Inventor score
Top patents by PatentIndex Score
14 records- 0181US6157030AIon trap mass spectrometerHITACHI LTD·Filed 1998·Granted Dec 5, 2000·39 cites·21 claims
- 0281US5261403AMagnetic resonance imaging apparatusHITACHI LTD·Filed 1992·Granted Nov 16, 1993·47 cites·7 claims
- 0379US7053367B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2001·Granted May 30, 2006·15 cites·17 claims
- 0470US7612572B2Probe and method of manufacturing a probeFUJITSU LTD·Filed 2006·Granted Nov 3, 2009·6 cites·5 claims
- 0566US7868635B2ProbeFUJITSU LTD·Filed 2008·Granted Jan 11, 2011·4 cites·2 claims
- 0656US5888766AMethod for producing recombinant human myoglobinORIENTAL YEAST CO LTD·Filed 1995·Granted Mar 30, 1999·10 cites·11 claims
- 0748US2010105297A1Polishing apparatusFUJITSU LTD·Filed 2009·Application pending·0 cites
- 0847US4814709AMethod of selecting specific region of sampleHITACHI LTD·Filed 1986·Granted Mar 21, 1989·10 cites·4 claims
- 0942US2007229097A1Probe, probe card, and testing deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1041US5109198ANuclear magnetic resonance imaging apparatusHITACHI LTD·Filed 1990·Granted Apr 28, 1992·9 cites·14 claims
- 1138US5245285AProbe for magnetic resonance inspection apparatusHITACHI LTD·Filed 1991·Granted Sep 14, 1993·7 cites·24 claims
- 1235US2010007365A1Socket for double ended probe, double ended probe, and probe unitFUJITSU LTD·Filed 2009·Application pending·0 cites
- 1335US2017332965A1Measurement system, head-mounted device, non-transitory computer readable medium, and service providing methodHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
- 1434US4755749AStrobo electron beam apparatusFUJITSU LTD·Filed 1986·Granted Jul 5, 1988·5 cites·7 claims
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