Inventor · disambiguated record
Bjorn Brauer
Also filed as: BRAUER BJORN
45 granted patents·1 pending application·145 citations·filing 2015–2022
97Inventor score
Top patents by PatentIndex Score
46 records- 0195US10115040B2Convolutional neural network-based mode selection and defect classification for image fusionKLA TENCOR CORP·Filed 2016·Granted Oct 30, 2018·22 cites·19 claims
- 0294US10620135B2Identifying a source of nuisance defects on a waferKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·7 cites·19 claims
- 0394US10360477B2Accelerating semiconductor-related computations using learning based modelsKLA TENCOR CORP·Filed 2017·Granted Jul 23, 2019·22 cites·39 claims
- 0491US11328410B2Deep generative models for optical or other mode selectionKLA CORP·Filed 2021·Granted May 10, 2022·2 cites·23 claims
- 0591US11120546B2Unsupervised learning-based reference selection for enhanced defect inspection sensitivityKLA CORP·Filed 2020·Granted Sep 14, 2021·3 cites·27 claims
- 0691US10713534B2Training a learning based defect classifierKLA TENCOR CORP·Filed 2018·Granted Jul 14, 2020·9 cites·52 claims
- 0791US9702827B1Optical mode analysis with design-based care areasKLA TENCOR CORP·Filed 2015·Granted Jul 11, 2017·8 cites·20 claims
- 0890US10698325B2Performance monitoring of design-based alignmentKLA TENCOR CORP·Filed 2019·Granted Jun 30, 2020·5 cites·19 claims
- 0989US11961219B2Generative adversarial networks (GANs) for simulating specimen imagesKLA CORP·Filed 2021·Granted Apr 16, 2024·2 cites·18 claims
- 1089US10600175B2Dynamic care areas for defect detectionKLA TENCOR CORP·Filed 2017·Granted Mar 24, 2020·4 cites·17 claims
- 1188US11416982B2Controlling a process for inspection of a specimenKLA CORP·Filed 2020·Granted Aug 16, 2022·2 cites·20 claims
- 1287US11415531B2Statistical learning-based mode selection for multi-mode inspectionKLA CORP·Filed 2020·Granted Aug 16, 2022·2 cites·20 claims
- 1387US10395358B2High sensitivity repeater defect detectionKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·7 cites·35 claims
- 1487US10151706B1Inspection for specimens with extensive die to die process variationKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·5 cites·20 claims
- 1586US10192302B2Combined patch and design-based defect detectionKLA TENCOR CORP·Filed 2016·Granted Jan 29, 2019·5 cites·20 claims
- 1685US12229935B2Semantic image segmentation for semiconductor-based applicationsKLA CORP·Filed 2022·Granted Feb 18, 2025·1 cites·18 claims
- 1785US10922808B2File selection for test image to design alignmentKLA CORP·Filed 2019·Granted Feb 16, 2021·3 cites·19 claims
- 1885US10557802B2Capture of repeater defects on a semiconductor waferKLA TENCOR CORP·Filed 2018·Granted Feb 11, 2020·2 cites·20 claims
- 1984US10402688B2Data augmentation for convolutional neural network-based defect inspectionKLA TENCOR CORP·Filed 2017·Granted Sep 3, 2019·5 cites·18 claims
- 2082US11328435B2Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methodsKLA CORP·Filed 2021·Granted May 10, 2022·1 cites·28 claims
- 2182US11010885B2Optical-mode selection for multi-mode semiconductor inspectionKLA TENCOR CORP·Filed 2019·Granted May 18, 2021·5 cites·14 claims
- 2280US10801968B2Algorithm selector based on image framesKLA TENCOR CORP·Filed 2019·Granted Oct 13, 2020·2 cites·20 claims
- 2380US10648925B2Repeater defect detectionKLA TENCOR CORP·Filed 2017·Granted May 12, 2020·3 cites·19 claims
- 2478US11113827B2Pattern-to-design alignment for one-dimensional unique structuresKLA CORP·Filed 2019·Granted Sep 7, 2021·2 cites·19 claims
- 2577US11580650B2Multi-imaging mode image alignmentKLA CORP·Filed 2020·Granted Feb 14, 2023·1 cites·19 claims
- 2676US10818005B2Previous layer nuisance reduction through oblique illuminationKLA—TENCOR CORP·Filed 2019·Granted Oct 27, 2020·2 cites·22 claims
- 2775US10535131B2Systems and methods for region-adaptive defect detectionKLA TENCOR CORP·Filed 2016·Granted Jan 14, 2020·3 cites·54 claims
- 2874US10504213B2Wafer noise reduction by image subtraction across layersKLA TENCOR CORP·Filed 2017·Granted Dec 10, 2019·2 cites·5 claims
- 2974US10127651B2Defect sensitivity of semiconductor wafer inspectors using design data with wafer image dataKLA TENCOR CORP·Filed 2016·Granted Nov 13, 2018·2 cites·20 claims
- 3073US10186028B2Defect signal to noise enhancement by reducing die to die process noiseKLA TENCOR CORP·Filed 2016·Granted Jan 22, 2019·2 cites·15 claims
- 3170US10957035B2Defect classification by fitting optical signals to a point-spread functionKLA TENCOR CORP·Filed 2019·Granted Mar 23, 2021·1 cites·18 claims
- 3269US10964016B2Combining simulation and optical microscopy to determine inspection modeKLA TENCOR CORP·Filed 2019·Granted Mar 30, 2021·1 cites·18 claims
- 3368US11694327B2Cross layer common-unique analysis for nuisance filteringKLA TENCOR CORP·Filed 2021·Granted Jul 4, 2023·0 cites·21 claims
- 3467US10360671B2Tool health monitoring and matchingKLA TENCOR CORP·Filed 2017·Granted Jul 23, 2019·2 cites·23 claims
- 3561US11748872B2Setting up inspection of a specimenKLA CORP·Filed 2021·Granted Sep 5, 2023·0 cites·25 claims
- 3658US11983865B2Deep generative model-based alignment for semiconductor applicationsKLA CORP·Filed 2021·Granted May 14, 2024·0 cites·22 claims
- 3758US11151711B2Cross layer common-unique analysis for nuisance filteringKLA TENCOR CORP·Filed 2018·Granted Oct 19, 2021·0 cites·18 claims
- 3856US11204332B2Repeater defect detectionKLA TENCOR CORP·Filed 2020·Granted Dec 21, 2021·0 cites·19 claims
- 3953US11615993B2Clustering sub-care areas based on noise characteristicsKLA CORP·Filed 2020·Granted Mar 28, 2023·0 cites·19 claims
- 4051US12056867B2Image contrast metrics for deriving and improving imaging conditionsKLA CORP·Filed 2021·Granted Aug 6, 2024·0 cites·15 claims
- 4151US2023075297A1Wafer alignment improvement through image projection-based patch-to-design alignmentKLA CORP·Filed 2021·Application pending·0 cites
- 4249US11328411B2Print check repeater defect detectionKLA CORP·Filed 2021·Granted May 10, 2022·0 cites·21 claims
- 4347US11619592B2Selecting defect detection methods for inspection of a specimenKLA CORP·Filed 2020·Granted Apr 4, 2023·0 cites·23 claims
- 4446US11049745B2Defect-location determination using correction loop for pixel alignmentKLA TENCOR CORP·Filed 2019·Granted Jun 29, 2021·0 cites·16 claims
- 4545US11431976B2System and method for inspection using tensor decomposition and singular value decompositionKLA CORP·Filed 2020·Granted Aug 30, 2022·0 cites·29 claims
- 4645US10600177B2Nuisance reduction using location-based attributesKLA TENCOR CORP·Filed 2017·Granted Mar 24, 2020·0 cites·19 claims
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