Inventor · disambiguated record
James S. Vickers
Also filed as: VICKERS JAMES · VICKERS JAMES S · VICKERS JAMES SQUIRE
27 granted patents·6 pending applications·896 citations·filing 1996–2025
97Inventor score
Top patents by PatentIndex Score
33 records- 0198US8344745B2Test structures for evaluating a fabrication of a die or a waferTAU METRIX INC·Filed 2006·Granted Jan 1, 2013·90 cites·16 claims
- 0298US7736916B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2007·Granted Jun 15, 2010·97 cites·11 claims
- 0397US7256055B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2004·Granted Aug 14, 2007·134 cites·31 claims
- 0496US6621275B2Time resolved non-invasive diagnostics systemOPTONICS INC·Filed 2001·Granted Sep 16, 2003·137 cites·25 claims
- 0595US7423288B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2007·Granted Sep 9, 2008·26 cites·40 claims
- 0694US7605597B2Intra-chip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2007·Granted Oct 20, 2009·18 cites·10 claims
- 0794US7220990B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2004·Granted May 22, 2007·59 cites·59 claims
- 0892US6594086B1Bi-convex solid immersion lensOPTONICS INC A CREDENCE COMPAN·Filed 2002·Granted Jul 15, 2003·71 cites·19 claims
- 0991US6720588B2Avalanche photodiode for photon counting applications and method thereofOPTONICS INC·Filed 2002·Granted Apr 13, 2004·63 cites·20 claims
- 1089US6797581B2Avalanche photodiode for photon counting applications and method thereofCREDENCE SYSTEMS CORP·Filed 2003·Granted Sep 28, 2004·47 cites·30 claims
- 1189US6778327B2Bi-convex solid immersion lensCREDENCE SYSTEMS CORP·Filed 2003·Granted Aug 17, 2004·33 cites·20 claims
- 1288US9201096B2Laser-assisted device alteration using synchronized laser pulsesDCG SYSTEMS INC·Filed 2013·Granted Dec 1, 2015·7 cites·20 claims
- 1388US7492529B2Bi-convex solid immersion lensDCG SYSTEMS INC·Filed 2007·Granted Feb 17, 2009·9 cites·38 claims
- 1488US7339388B2Intra-clip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2004·Granted Mar 4, 2008·25 cites·26 claims
- 1586US7224828B2Time resolved non-invasive diagnostics systemCREDENCE SYSTEMS CORP·Filed 2003·Granted May 29, 2007·27 cites·20 claims
- 1685US7466852B2Time resolved non-invasive diagnostics systemDCG SYSTEMS INC·Filed 2007·Granted Dec 16, 2008·11 cites·34 claims
- 1782US7723724B2System for using test structures to evaluate a fabrication of a waferTAU METRIX INC·Filed 2008·Granted May 25, 2010·4 cites·10 claims
- 1874US2025347640A1Techniques for reducing electromagnetic interference effects in charged particle microscopyFEI CO·Filed 2025·Application pending·0 cites
- 1974US2025347641A1Techniques for reducing electromagnetic interference effects in charged particle microscopyFEI CO·Filed 2025·Application pending·0 cites
- 2073US8410568B2Integrated photodiode for semiconductor substratesSTEINBRUECK GARY·Filed 2009·Granted Apr 2, 2013·3 cites·12 claims
- 2171US7227702B2Bi-convex solid immersion lensCREDENCE SYSTEMS CORP·Filed 2004·Granted Jun 5, 2007·9 cites·11 claims
- 2271US2016104812A1Integrated photodiode for semiconductor substratesTAU METRIX INC·Filed 2014·Application pending·0 cites
- 2370US10209274B2Laser-assisted device alteration using synchronized laser pulsesFEI EFA INC·Filed 2015·Granted Feb 19, 2019·1 cites·14 claims
- 2466US8872297B2Integrated photodiode for semiconductor substratesTAU METRIX INC·Filed 2013·Granted Oct 28, 2014·0 cites·29 claims
- 2564US11353479B2Laser-assisted device alteration using synchronized laser pulsesFEI EFA INC·Filed 2019·Granted Jun 7, 2022·0 cites·23 claims
- 2663US11605525B2System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2020·Granted Mar 14, 2023·0 cites·17 claims
- 2760US2019287762A1System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2019·Application pending·0 cites
- 2857US5693946ASingle photon imaging with a Bi-Linear charge-coupled device arrayUNIV BOSTON·Filed 1996·Granted Dec 2, 1997·25 cites·32 claims
- 2952US10126360B2Systems and method for laser voltage imagingFEI EFA INC·Filed 2015·Granted Nov 13, 2018·0 cites·29 claims
- 3048US9361533B2Apparatus and method for polarization diversity imaging and alignmentDCG SYSTEMS INC·Filed 2012·Granted Jun 7, 2016·0 cites·20 claims
- 3147US2025069842A1Techniques for waveform detection of periodic signals using voltage contrastFEI CO·Filed 2023·Application pending·0 cites
- 3242US2019227119A1System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2019·Application pending·0 cites
- 3337US7009173B2Lens mount integrated with a thermoelectrically cooled photodetector moduleCREDENCE SYSTEMS CORP·Filed 2004·Granted Mar 7, 2006·0 cites·20 claims
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