Inventor · disambiguated record
Chung-Lun Kuo
Also filed as: KUO CHUNG-LUN
9 granted patents·1 pending application·11 citations·filing 2004–2024
78Inventor score
Top patents by PatentIndex Score
10 records- 0188US11507020B2Optical measurement system for obtaining and analyzing surface topography of objectIND TECH RES INST·Filed 2020·Granted Nov 22, 2022·2 cites·18 claims
- 0267US12270638B2Measurement system and measurement methodIND TECH RES INST·Filed 2022·Granted Apr 8, 2025·0 cites·12 claims
- 0364US10474231B2Eye tracking apparatus and method thereofIND TECH RES INST·Filed 2017·Granted Nov 12, 2019·1 cites·22 claims
- 0461US12007221B2Heterogeneous integration detecting method and heterogeneous integration detecting apparatusIND TECH RES INST·Filed 2021·Granted Jun 11, 2024·0 cites·10 claims
- 0559US12203971B2Apparatus and method for inspecting light-emitting diode diesIND TECH RES INST·Filed 2022·Granted Jan 21, 2025·0 cites·16 claims
- 0658US12099053B2Method of training AI for label-free cell viability determination and label-free cell viability determination method by trained AIIND TECH RES INST·Filed 2021·Granted Sep 24, 2024·0 cites·9 claims
- 0755US7469376B2System and method for compiling documents and tracking technology changes in a semiconductor manufacturing environment using a document generation engineTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Dec 23, 2008·8 cites·22 claims
- 0851US2025370175A1Optical structureVISERA TECHNOLOGIES CO LTD·Filed 2024·Application pending·0 cites
- 0948US11656181B2Inspection apparatus and inspection method for inspecting light-emitting diodesIND TECH RES INST·Filed 2020·Granted May 23, 2023·0 cites·24 claims
- 1048US11474144B2Method for inspecting light-emitting diodes and inspection apparatusIND TECH RES INST·Filed 2020·Granted Oct 18, 2022·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →