Inventor · disambiguated record
Gordon Rouse
Also filed as: ROUSE GORDON · ROUSE GORDON CHARLES
8 granted patents·1 pending application·425 citations·filing 2006–2024
86Inventor score
Top patents by PatentIndex Score
9 records- 0197US7676077B2Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2006·Granted Mar 9, 2010·277 cites·58 claims
- 0296US8041103B2Methods and systems for determining a position of inspection data in design data spaceKLA TENCOR TECH CORP·Filed 2007·Granted Oct 18, 2011·85 cites·18 claims
- 0395US8139843B2Methods and systems for utilizing design data in combination with inspection dataKULKARNI ASHOK·Filed 2011·Granted Mar 20, 2012·55 cites·31 claims
- 0491US10832396B2And noise based care areasKLA TENCOR CORP·Filed 2019·Granted Nov 10, 2020·8 cites·34 claims
- 0562US12450857B2Automatic method to find extent of repeating geometry in an integrated circuit layoutKLA CORP·Filed 2024·Granted Oct 21, 2025·0 cites·23 claims
- 0657US12353970B2Finding semiconductor defects using convolutional context attributesKLA CORP·Filed 2020·Granted Jul 8, 2025·0 cites·26 claims
- 0748US10475178B1System, method and computer program product for inspecting a wafer using a film thickness map generated for the waferKLA TENCOR CORP·Filed 2017·Granted Nov 12, 2019·0 cites·17 claims
- 0846US2010119144A1Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2010·Application pending·0 cites
- 0937US10387601B2Methods to store dynamic layer content inside a design fileKLA TENCOR CORP·Filed 2016·Granted Aug 20, 2019·0 cites·17 claims
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