Inventor · disambiguated record
Nobuhiro Okai
Also filed as: OKAI NOBUHIRO
11 granted patents·2 pending applications·15 citations·filing 2008–2022
83Inventor score
Top patents by PatentIndex Score
13 records- 0178US10121632B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 6, 2018·2 cites·13 claims
- 0273US8742342B2Electron microscopeOKAI NOBUHIRO·Filed 2010·Granted Jun 3, 2014·3 cites·14 claims
- 0371US8969801B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2012·Granted Mar 3, 2015·2 cites·18 claims
- 0467US9261360B2Charged particle beam microscopeOKAI NOBUHIRO·Filed 2011·Granted Feb 16, 2016·2 cites·8 claims
- 0565US8125518B2Scanning electron microscopeOKAI NOBUHIRO·Filed 2009·Granted Feb 28, 2012·1 cites·14 claims
- 0663US8064681B2Method and apparatus for inspecting reticleOKAI NOBUHIRO·Filed 2008·Granted Nov 22, 2011·5 cites·16 claims
- 0761US11852599B2Image processing systemHITACHI HIGH TECH CORP·Filed 2021·Granted Dec 26, 2023·0 cites·15 claims
- 0852US2023238212A1Electron MicroscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0951US11211224B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Dec 28, 2021·0 cites·12 claims
- 1051US2025003898A1Foreign object height measurement method and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1145US8907267B2Charged particle beam deviceWANG ZHIGANG·Filed 2012·Granted Dec 9, 2014·0 cites·12 claims
- 1244US8487251B2Method for controlling charging of sample and scanning electron microscopeFUKAYA RITSUO·Filed 2009·Granted Jul 16, 2013·0 cites·7 claims
- 1340US8692197B2Scanning electron microscope optical condition setting method and scanning electron microscopeWANG ZHIGANG·Filed 2011·Granted Apr 8, 2014·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →