Inventor · disambiguated record
Henry Chen
Also filed as: CHEN HENRY · CHEN HENRY K · CHEN HENRY KUO-SHUN
28 granted patents·9 pending applications·215 citations·filing 2000–2015
96Inventor score
Top patents by PatentIndex Score
37 records- 0195US7223982B1Segmented radiation detector with side shielding cathodeREDLEN TECHNOLOGIES·Filed 2006·Granted May 29, 2007·48 cites·28 claims
- 0289US9202961B2Imaging devices with solid-state radiation detector with improved sensitivityREDLEN TECHNOLOGIES·Filed 2013·Granted Dec 1, 2015·10 cites·25 claims
- 0388US8269275B2Method for fabricating a MOS transistor with reduced channel length variation and related structureCHEN XIANGDONG·Filed 2009·Granted Sep 18, 2012·9 cites·17 claims
- 0487US7955992B2Method of passivating and encapsulating CdTe and CZT segmented detectorsREDLEN TECHNOLOGIES INC·Filed 2008·Granted Jun 7, 2011·17 cites·21 claims
- 0585US8476101B2Method of fabricating patterned CZT and CdTe devicesCHEN HENRY·Filed 2009·Granted Jul 2, 2013·9 cites·16 claims
- 0684US7728304B2Method of making segmented contacts for radiation detectors using direct photolithographyREDLEN TECHNOLOGIES·Filed 2006·Granted Jun 1, 2010·11 cites·29 claims
- 0782US9041153B2MIM capacitor having a local interconnect metal electrode and related structureCHEN XIANGDONG·Filed 2011·Granted May 26, 2015·7 cites·10 claims
- 0881US8048765B2Method for fabricating a MOS transistor with source/well heterojunction and related structureBROADCOM CORP·Filed 2009·Granted Nov 1, 2011·9 cites·20 claims
- 0981US7589324B2Use of solder mask as a protective coating for radiation detectorREDLEN TECHNOLOGIES·Filed 2006·Granted Sep 15, 2009·13 cites·9 claims
- 1081US7462833B2Multi-functional cathode packaging design for solid-state radiation detectorsREDLEN TECHNOLOGIES·Filed 2007·Granted Dec 9, 2008·8 cites·36 claims
- 1180US8748277B2Method for fabricating a MOS transistor with reduced channel length variationCHEN XIANGDONG·Filed 2012·Granted Jun 10, 2014·3 cites·20 claims
- 1280US8598670B2Semiconductor device with increased breakdown voltageITO AKIRA·Filed 2010·Granted Dec 3, 2013·4 cites·29 claims
- 1379US7855414B2Semiconductor device with increased breakdown voltageBROADCOM CORP·Filed 2006·Granted Dec 21, 2010·6 cites·27 claims
- 1478US8614423B2Solid-state radiation detector with improved sensitivityCHEN HENRY·Filed 2009·Granted Dec 24, 2013·5 cites·20 claims
- 1575US6985387B2System and method for one-time programmed memory through direct-tunneling oxide breakdownBROADCOM CORP·Filed 2004·Granted Jan 10, 2006·18 cites·19 claims
- 1675US6960819B2System and method for one-time programmed memory through direct-tunneling oxide breakdownBROADCOM CORP·Filed 2000·Granted Nov 1, 2005·20 cites·20 claims
- 1768US8659081B2Transistor with reduced channel length variationCHEN XIANGDONG·Filed 2012·Granted Feb 25, 2014·1 cites·9 claims
- 1867US8699306B2Silent alarm and exam notification timer deviceESTRADA JORGE L·Filed 2011·Granted Apr 15, 2014·3 cites·9 claims
- 1966US8890288B2MOM capacitor having local interconnect metal plates and related methodCHEN XIANGDONG·Filed 2011·Granted Nov 18, 2014·2 cites·10 claims
- 2062US8089118B2Method for selective gate halo implantation in a semiconductor die and related structureCHEN XIANGDONG·Filed 2009·Granted Jan 3, 2012·1 cites·20 claims
- 2158US7449365B2Wafer-level flipchip package with IC circuit isolationBROADCOM CORP·Filed 2006·Granted Nov 11, 2008·2 cites·25 claims
- 2258US7009891B2System and method for one-time programmed memory through direct-tunneling oxide breakdownBROADCOM CORP·Filed 2005·Granted Mar 7, 2006·3 cites·20 claims
- 2357US2014299964A1On-chip inductor using redistribution layer and dual-layer passiviationBROADCOM CORP·Filed 2014·Application pending·0 cites
- 2454US8071953B2ACF attachment for radiation detectorLU PINGHE·Filed 2008·Granted Dec 6, 2011·2 cites·26 claims
- 2554US2012267737A1Side shielding cathode design for a radiation detector with improved efficiencyCHEN HENRY·Filed 2012·Application pending·0 cites
- 2652US2014084368A1Semiconductor Device with Increased Breakdown VoltageBROADCOM CORP·Filed 2013·Application pending·0 cites
- 2747US6950355B2System and method to screen defect related reliability failures in CMOS SRAMSBROADCOM CORP·Filed 2001·Granted Sep 27, 2005·4 cites·13 claims
- 2843US2008246080A1Shallow trench isolation (STI) based laterally diffused metal oxide semiconductor (LDMOS)BROADCOM CORP·Filed 2008·Application pending·0 cites
- 2942US8717137B2On-chip inductor using redistribution layer and dual-layer passivationCHEN HENRY KUO-SHUN·Filed 2006·Granted May 6, 2014·0 cites·20 claims
- 3040US2015356852A1Temperature and Humidity Alerting SystemESTRADA JORGE·Filed 2014·Application pending·0 cites
- 3139US9293584B2FinFET devicesCHEN XIANGDONG·Filed 2011·Granted Mar 22, 2016·0 cites·20 claims
- 3238US2010284210A1One-time programmable memory cellBROADCOM CORP·Filed 2009·Application pending·0 cites
- 3335US2003034489A1Apparatus and method for a production testline to monitor CMOS SRAMsBROADCOM CORP·Filed 2002·Application pending·0 cites
- 3434US9128828B2Exam notification timer deviceESTRADA JORGE L·Filed 2012·Granted Sep 8, 2015·0 cites·18 claims
- 3534US2011169079A1Semiconductor device having an overlapping multi-well implant and method for fabricating sameBROADCOM CORP·Filed 2010·Application pending·0 cites
- 3629US2002060327A1Metallic bridge structure for hetero-junction bipolar transistorFiled 2001·Application pending·0 cites
- 3720US9601159B2Remotely controlled audio and video recording systemESTRADA JORGE L·Filed 2015·Granted Mar 21, 2017·0 cites·12 claims
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